Search Results - "Computers testing"

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  1. 1

    Authors: Cho, Adrian (AUTHOR)

    Source: Science (pre-March 2025). 6/28/2019, Vol. 364 Issue 6447, p1218-1219. 2p. 1 Color Photograph, 1 Chart.

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  2. 2

    Source: DAC: Annual ACM/IEEE Design Automation Conference; Jun2016, p1030-1035, 6p

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  3. 3

    Alternate Title: Скорректированные алгоритмы для системы тестирования пилотов на основе ограничений процесса обучения.
    Скореговані алгоритми для системи тестування пілотів на основі обмежень процесу навчання.

    Source: Electronics & Control Systems. 2016, Vol. 48 Issue 2, p127-131. 5p. 3 Diagrams.

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    Source: Journal of Information Science & Engineering; Sep2014, Vol. 30 Issue 5, p1619-1634, 16p

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  8. 8

    Authors: Šimůnek, Milan1, simunek@vse.cz

    Source: Systémová Integrace; 2013, Vol. 20 Issue 2, p67-80, 14p

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    Source: International Journal of Information Security; Jun2008, Vol. 7 Issue 3, p219-242, 24p, 11 Diagrams

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    Source: Proceedings of the International Symposium on Information Systems & Applications; 2009, p583-585, 3p, 4 Charts

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  11. 11

    Source: PCWorld; Jun2012, Vol. 30 Issue 6, p84-86, 3p, 2 Color Photographs, 1 Chart

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    Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Aug2017, Vol. 25 Issue 8, p2346-2359, 14p

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    Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Oct2016, Vol. 24 Issue 10, p3055-3066, 12p

  18. 18

    Authors: Stolicny, Carol1

    Source: IEEE Design & Test of Computers. Jan/Feb2007, Vol. 24 Issue 1, p94-96. 3p.

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    Source: Visual Computer; May2015, Vol. 31 Issue 5, p643-655, 13p

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    Source: Information & Software Technology; Feb2015, Vol. 58, p355-372, 18p