Search Results - "Amin, L."
-
1
Authors:
Source: PLoS Neglected Tropical Diseases. 5/18/2026, Vol. 20 Issue 5, p1-18. 18p.
HTML Full Text PDF Full Text -
2
Authors:
Source: Science and engineering ethics [Sci Eng Ethics] 2026 Mar 05; Vol. 32 (2). Date of Electronic Publication: 2026 Mar 05.
Publication Type: Journal Article; Review
Journal Info: Publisher: Opragen Publications Country of Publication: England NLM ID: 9516228 Publication Model: Electronic Cited Medium: Internet ISSN: 1471-5546 (Electronic) Linking ISSN: 13533452 NLM ISO Abbreviation: Sci Eng Ethics Subsets: MEDLINE
HTML Full Text PDF Full Text -
3
Authors: et al.
Source: BMC oral health [BMC Oral Health] 2026 Jun 22. Date of Electronic Publication: 2026 Jun 22.
Publication Type: Journal Article
Journal Info: Publisher: BioMed Central Country of Publication: England NLM ID: 101088684 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1472-6831 (Electronic) Linking ISSN: 14726831 NLM ISO Abbreviation: BMC Oral Health Subsets: MEDLINE
-
4
Authors: et al.
Source: Molecular genetics and genomics : MGG [Mol Genet Genomics] 2026 May 27; Vol. 301 (1). Date of Electronic Publication: 2026 May 27.
Publication Type: Journal Article
Journal Info: Publisher: Springer-Verlag Country of Publication: Germany NLM ID: 101093320 Publication Model: Electronic Cited Medium: Internet ISSN: 1617-4623 (Electronic) Linking ISSN: 16174623 NLM ISO Abbreviation: Mol Genet Genomics Subsets: MEDLINE
-
5
Authors: et al.
Source: PloS one [PLoS One] 2025 Jul 16; Vol. 20 (7), pp. e0323061. Date of Electronic Publication: 2025 Jul 16 (Print Publication: 2025).
Publication Type: Journal Article
Journal Info: Publisher: Public Library of Science Country of Publication: United States NLM ID: 101285081 Publication Model: eCollection Cited Medium: Internet ISSN: 1932-6203 (Electronic) Linking ISSN: 19326203 NLM ISO Abbreviation: PLoS One Subsets: MEDLINE
HTML Full Text PDF Full Text -
6
Authors: et al.
Source: The Annals of otology, rhinology, and laryngology [Ann Otol Rhinol Laryngol] 2025 Jun; Vol. 134 (6), pp. 459-462. Date of Electronic Publication: 2025 Feb 19.
Publication Type: Journal Article
Journal Info: Publisher: Sage Country of Publication: United States NLM ID: 0407300 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1943-572X (Electronic) Linking ISSN: 00034894 NLM ISO Abbreviation: Ann Otol Rhinol Laryngol Subsets: MEDLINE
HTML Full Text PDF Full Text -
7
Authors: et al.
Source: Science. 5/15/2025, Vol. 388 Issue 6748, p1-14. 14p.
HTML Full Text PDF Full Text -
8
Authors: et al.
Source: Scientific reports [Sci Rep] 2026 Feb 08; Vol. 16 (1). Date of Electronic Publication: 2026 Feb 08.
Publication Type: Journal Article; Comparative Study
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE
HTML Full Text PDF Full Text -
9
-
10
Authors: et al.
Source: PLoS Pathogens. 10/16/2025, Vol. 21 Issue 10, p1-22. 22p.
HTML Full Text PDF Full Text -
11
Authors: et al.
Source: Science. 4/18/2025, Vol. 388 Issue 6744, p1-15. 15p.
HTML Full Text PDF Full Text -
12
Authors: et al.
Source: Chalcogenide Letters. Apr2025, Vol. 22 Issue 4, p441-450. 10p.
PDF Full Text -
13
Authors: et al.
Source: Iranian Journal of Pathology. Spring2026, Vol. 21 Issue 2, p332-336. 5p.
PDF Full Text -
14
Authors: et al.
Source: Advanced Science. 2/27/2026, Vol. 13 Issue 12, p1-19. 19p.
HTML Full Text PDF Full Text -
15
Authors: et al.
Source: Discover Public Health. 2/25/2026, Vol. 23 Issue 1, p1-13. 13p.
HTML Full Text PDF Full Text -
16
Authors: et al.
Source: PLoS Neglected Tropical Diseases. 2/11/2026, Vol. 20 Issue 2, p1-14. 14p.
HTML Full Text PDF Full Text -
17
Authors: et al.
Source: Current Oncology. Feb2026, Vol. 31 Issue 2, p68. 14p.
HTML Full Text PDF Full Text -
18
Authors: et al.
Source: Kompass Pneumologie. 2025, Vol. 13 Issue 5, p321-325. 5p.
HTML Full Text PDF Full Text -
19
Authors: et al.
Source: PLoS ONE. 8/22/2025, Vol. 20 Issue 8, p1-15. 15p.
HTML Full Text PDF Full Text -
20
Authors: et al.
Source: Journal of Electronic Materials; Aug2025, Vol. 54 Issue 8, p6471-6491, 21p
HTML Full Text PDF Full Text