Search Results - "Comte M"

Childhood neglect predicts disorganization in schizophrenia through grey matter decrease in dorsolateral prefrontal cortex.

Authors: Cancel, A. Comte, M. Truillet, R. et al.

Source: Acta Psychiatrica Scandinavica. Oct2015, Vol. 132 Issue 4, p244-256. 13p. 1 Diagram, 1 Chart, 2 Graphs.

Subjects: Children, Schizotypal personality disorder, Mental illness, Prefrontal cortex, Depersonalization

On the Newton partially flat minimal resistance body type problems.

Authors: Comte, M. Diaz, J. I.

Source: Journal of the European Mathematical Society (EMS Publishing). Oct2005, Vol. 7 Issue 4, p395-411. 17p.

FUNCTIONS AND DOMAINS HAVING MINIMAL RESISTANCE UNDER A SINGLE-IMPACT ASSUMPTION.

Authors: Comte, M. Lachand-Robert, T.

Source: SIAM Journal on Mathematical Analysis. 2002, Vol. 34 Issue 1, p101. 20p. 1 Diagram, 2 Graphs.

Subjects: Polygons, Newton-Raphson method, Mathematical optimization

Existence of minimizers for Newton's problem of the body of minimal resistance under a single impact assumption.

Authors: Comte, M. Lachand-Robert, T.

Source: Journal d'Analyse Mathématique. Dec2001, Vol. 83 Issue 1, p313-335. 23p.

A nonexistence result for a nonlinear equation involving critical Sobolev exponent.

Authors: Rodriguez, A. Carpio Comte, M. Lewandowski, R.

Source: Annales de l'Institut Henri Poincaré C. May2016, Vol. 9 Issue 3, p243-261. 19p.

Rol del ultrasonido como herramienta de control y diagnóstico de la Morfea juvenil. Implicancias en la práctica dermatológica.

Alternate Title: Role of ultrasound as a tool for monitoring and diagnosis of juvenile morphea. Implications in dermatological practice.

Authors: Muñoz C., Mariana Cabezas I., Dora Fuentes C., Florencia et al.

Source: Revista ANACEM. 2025, Vol. 19 Issue 2, p151-157. 7p.

The mirror cracked.

Authors: Clements, M. Comte, M.

Source: New York Times Magazine. 9/15/91, Vol. 140 Issue 4872, p69. 7p. 4 Color Photographs, 3 Black and White Photographs.

Subjects: Clothing & dress

Telling touches.

Authors: Comte, M.

Source: New York Times Magazine. 8/26/90, Vol. 139 Issue 4833, Part 2 p118. 6p. 6 Color Photographs.

Subjects: Fashion

Breaking away.

Authors: Comte, M.

Source: New York Times Magazine. 3/18/90, Vol. 139 Issue 4817, Part 2 p70. 4p. 4 Color Photographs.

Subjects: Fashion

Efficient broadband 400 nm noncollinear second-harmonic generation of chirped femtosecond laser pulses in BBO and LBO.

Authors: Gobert, O. Mennerat, G. Maksimenka, R. et al.

Source: Applied Optics (1559-128X); 4/20/2014, Vol. 53 Issue 12, p2646-2655, 10p

Jacket magic.

Authors: Comte, M. Donovan, C.

Source: New York Times Magazine. 11/18/90, Vol. 140 Issue 4842, p66. 3p. 4 Color Photographs.

Subjects: Clothing & dress

Warming trends.

Authors: Comte, M.

Source: Esquire. Aug90, Vol. 114 Issue 2, p100. 8p. 4 Color Photographs, 4 Black and White Photographs.

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits.

Authors: El Badawi, H. Azais, F. Bernard, S. et al.

Source: Journal of Electronic Testing. Apr2023, Vol. 39 Issue 2, p155-170. 16p.

Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit.

Authors: Badawi, H. El Azais, F. Bernard, S. et al.

Source: Journal of Electronic Testing. Apr2021, Vol. 37 Issue 2, p225-242. 18p.

Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits.

Authors: El Badawi, H. Azais, Florence Bernard, S. et al.

Source: Journal of Electronic Testing. Apr2020, Vol. 36 Issue 2, p189-203. 15p.

A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC.

Authors: Kerzérho, V. Bernard, S. Azaïs, F. et al.

Source: Microelectronics Journal. Sep2013, Vol. 44 Issue 9, p840-843. 4p.

Measurement of Carrier-Envelope-Phase shifts using spectral interferometry with a broad frequency laser source

Authors: Gobert, O. Fedorov, N. Tcherbakoff, O. et al.

Source: Optics Communications. Feb2012, Vol. 285 Issue 3, p322-327. 6p.

Study of the crystallization kinetics of LAS glass by differential scanning calorimetry, X-ray diffraction, and beam bending viscometry

Authors: Ovono Ovono, D. Berre, S. Pradeau, P. et al.

Source: Thermochimica Acta. Jan2012, Vol. 527, p158-164. 7p.

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC.

Authors: Kerzérho, V. Cauvet, P. Bernard, S. et al.

Source: IET Computers & Digital Techniques (Institution of Engineering & Technology). May2007, Vol. 1 Issue 3, p146-153. 8p. 1 Black and White Photograph, 8 Diagrams, 2 Charts, 2 Graphs.

A-to-D converters static error detection from dynamic parameter measurement

Authors: Azaïs, F. Bernard, S. Bertrand, Y. et al.

Source: Microelectronics Journal. Oct2003, Vol. 34 Issue 10, p945. 9p.