Search Results - "Defect tracking (Computer software development)"
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Authors: et al.
Source: Journal of Information Science & Engineering. May2026, Vol. 42 Issue 3, p703-726. 24p.
Subjects: Language models, Defect tracking (Computer software development), Intelligent tutoring systems, Memory, Software engineering, Computer programming education, Generative adversarial networks, Instructional systems
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Authors: et al.
Source: Journal of Intelligent Manufacturing; May2026, Vol. 37 Issue 5, p1789-1812, 24p
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Authors: et al.
Source: Kufa Journal of Engineering; Apr2026, Vol. 17 Issue 2, p134-149, 16p
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Authors: et al.
Source: Engineering, Technology & Applied Science Research; Apr2026, Vol. 16 Issue 2, p34257-34263, 7p
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Cross-Dataset Benchmarking of Deep Learning Models for Surface Defect Classification in Metal Parts.
Authors: et al.
Source: Applied Sciences (2076-3417); Mar2026, Vol. 16 Issue 6, p3022, 35p
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Source: Journal of Intelligent Manufacturing; Mar2026, Vol. 37 Issue 3, p1297-1325, 29p
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Authors: et al.
Source: Journal of Intelligent Manufacturing; Mar2026, Vol. 37 Issue 3, p1163-1178, 16p
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Source: IAENG International Journal of Computer Science; Mar2026, Vol. 53 Issue 3, p992-1006, 15p
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Authors: Mehta, Ashu1, ashu.23631@lpu.co.in
Source: International Journal of Performability Engineering; Mar2026, Vol. 22 Issue 3, p167-177, 11p
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Authors: et al.
Source: Applied Sciences (2076-3417); Feb2026, Vol. 16 Issue 4, p2061, 19p
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Authors: et al.
Source: KSII Transactions on Internet & Information Systems; Feb2026, Vol. 20 Issue 2, p627-645, 19p
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Source: Journal of Intelligent Manufacturing; Feb2026, Vol. 37 Issue 2, p573-596, 24p
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Source: IAENG International Journal of Computer Science; Feb2026, Vol. 53 Issue 2, p769-781, 13p
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Authors: et al.
Source: Applied Sciences (2076-3417); Feb2026, Vol. 16 Issue 3, p1568, 31p
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Source: Grenze International Journal of Engineering & Technology (GIJET); Jan2026, Vol. 12 Issue Part2, p4235-4239, 5p
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Authors: et al.
Source: Grenze International Journal of Engineering & Technology (GIJET); Jan2026, Vol. 12 Issue Part2, p3913-3919, 7p
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Source: Applied Sciences (2076-3417); Jan2026, Vol. 16 Issue 2, p1078, 18p
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Source: Journal of Intelligent Manufacturing; Jan2026, Vol. 37 Issue 1, p351-371, 21p
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Authors: et al.
Source: Journal of Computer Security; Jan2026, Vol. 34 Issue 1, p3-28, 26p
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Source: Mathematics (2227-7390). Jan2026, Vol. 14 Issue 1, p178. 19p.
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