Search Results - "Feng, Wenran"

One-pot synthesis, sensitization and photoelectric performance of calcium doped PbSe thin films.

Authors: Feng, Wenran Zhang, Xiaoke Hong, Anni et al.

Source: Journal of Materials Science: Materials in Electronics; Apr2024, Vol. 35 Issue 10, p1-10, 10p

Pb0.8Sn0.2Se thin films: synthesis, sensitization, and properties evolution.

Authors: Li, Zhen Chen, Yingying Lang, Haoze et al.

Source: Journal of Materials Science: Materials in Electronics; Mar2022, Vol. 33 Issue 8, p5564-5574, 11p

Enhanced photoelectric properties of PbSnSe thin films via quick oxygen ion-implantation sensitization.

Authors: Feng, Wenran Li, Zhen Chen, Yingying et al.

Source: Journal of Materials Science; Jan2022, Vol. 57 Issue 3, p1881-1889, 9p, 2 Diagrams, 1 Chart, 4 Graphs

Effects of Substrate Bias Voltage on Structural and Optical Properties of Co-Sputtered (AlxGa1–x)2O3 Films.

Authors: Gao, Yan Dong, Haitao Zhang, Xiaoke et al.

Source: Journal of Electronic Materials; Nov2023, Vol. 52 Issue 11, p7429-7437, 9p

PbSe sensitized with iodine and oxygen for high-performance photoelectronic detection.

Authors: Gao, Dahai Li, Yongqi Liu, Bohong et al.

Source: Materials Science in Semiconductor Processing; May2025, Vol. 190, pN.PAG-N.PAG, 1p

Pb0.8Sn0.2Se thin films: synthesis, sensitization, and properties evolution.

Authors: Li, Zhen Chen, Yingying Lang, Haoze et al.

Source: Journal of Materials Science: Materials in Electronics. Mar2022, Vol. 33 Issue 8, p5564-5574. 11p.

Subjects: Chemical solution deposition, Band gaps, Density of states, Chemical formulas, Thin films, Photoelectric effect, Resistance to change

In-situ oxygen sensitizing PbSnSe films for high-performance photoelectronic detection.

Authors: Dong, Haitao Gao, Yan Zhang, Xiaoke et al.

Source: Vacuum; Jan2023, Vol. 207, pN.PAG-N.PAG, 1p

Effects of Substrate Bias Voltage on Structural and Optical Properties of Co-Sputtered (AlxGa1–x)2O3 Films.

Authors: Gao, Yan Dong, Haitao Zhang, Xiaoke et al.

Source: Journal of Electronic Materials. Nov2023, Vol. 52 Issue 11, p7429-7437. 9p.

Subjects: Optical properties, Optical films, Voltage, X-ray diffraction measurement, Crystal structure, Zinc oxide films