Search Results - "Fried M"

Chebyshev-derived spindown parameters for gravitational wave signals from pulsars.

Authors: Valluri, S. R. Fried, M. D.

Source: Canadian Journal of Physics; April 2008, Vol. 86 Issue 4, p597-600, 4p

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Design, fabrication, and characterization of picowell arrays on cyclic olefin copolymer surfaces generated with a 10.5 MeV N4+ ion microbeam.

Authors: Bányász, I. Rajta, I. Havránek, V. et al.

Source: Applied Physics Letters; 7/31/2023, Vol. 123 Issue 5, p1-6, 6p

Ellipsometric characterization of damage profiles using advanced optical model.

Authors: Petrik, P. Polgár, O. Fried, M.

Source: Journal of Applied Physics; February 15 2003, Vol. 93 Issue 4, p1987-1990, 4p

Ellipsometric study of the polysilicon/thin oxide/single-crystalline silicon structure and its change upon annealing.

Authors: Petrik, P. Lohner, T. Fried, M.

Source: Journal of Applied Physics; September 1 2002, Vol. 92 Issue 5, p2374-2377, 4p

Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition.

Authors: Petrik, P. Lohner, T. Fried, M.

Source: Journal of Applied Physics; February 15 2000, Vol. 87 Issue 4, p1734-1742, 9p

Ion mixing enhanced wafer bonding for silicon-on-insulator structures.

Authors: Khánh, N. Q. Fried, M. Tóth, A.

Source: Journal of Applied Physics; December 15 1992, Vol. 72, p5602-5605, 4p

Nondestructive determination of damage depth profiles in ion-implanted semiconductors by multiple-angle-of-incidence single-wavelength ellipsometry using different optical models.

Authors: Fried, M. Lohner, T. Jároli, E.

Source: Journal of Applied Physics; September 15 1992, Vol. 72, p2197-2201, 5p

Nondestructive determination of damage depth profiles in ion-implanted semiconductors by spectroscopic ellipsometry using different optical models.

Authors: Fried, M. Lohner, T. Aarnink, W. A. M.

Source: Journal of Applied Physics; March 15 1992, Vol. 71, p2835-2843, 9p

Nondestructive characterization of nitrogen-implanted silicon-on-insulator structures by spectroscopic ellipsometry.

Authors: Fried, M. Lohner, T. de Nijs, J. M. M.

Source: Journal of Applied Physics; November 15 1989, Vol. 66, p5052-5057, 6p

Nondestructive detection of microvoids at the interface of direct bonded silicon wafers by scanning infrared microscopy.

Authors: Khánh, N. Q. Hámori, A. Fried, M.

Source: Journal of the Electrochemical Society; July 1995, Vol. 142, p2425-2429, 5p

Acid rain on Mt Carmel, Israel.

Authors: Singer, A. Shamay, Y. Fried, M.

Source: Atmospheric Environment. Part A, General Topics; October 1993, Vol. 27A Issue 15, p2287-2293, 7p

Throughfall deposition of sulfur to a mixed oak and pine forest in Israel.

Authors: Singer, A. Ganor, E. Fried, M.

Source: Atmospheric Environment; November 1996, Vol. 30 Issue 22, p3881-3889, 9p

Effect of particle size on availability to plants of phosphorus in phosphate rock from various sources.

Authors: Armiger, W. H. Fried, M.

Source: Journal of Agricultural & Food Chemistry; July 1958, Vol. 6, p539-543, 5p

Consumer spending, inflation and the wage earner in the United States.

Authors: Nathan, O. Fried, M.

Source: International Labour Review; February 1942, Vol. 45, p125-141, 17p

Contamination in orthophosphates irradiated in a neutron pile.

Authors: Fried, M. MacKenzie, A. J.

Source: Science; May 5 1950, Vol. 111, p492-493, 2p

Sulfur collection in precipitation by means of an all-weather noncorrosive rain and snow gauge.

Authors: Fried, M. I. Jackson, M. L.

Source: Science; July 4 1947, Vol. 106, p19-20, 2p

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Simeprevir with peginterferon/ribavirin for treatment of chronic hepatitis C virus genotype 1 infection: pooled safety analysis from Phase IIb and III studies.

Authors: Manns, M. P. Fried, M. W. Zeuzem, S. et al.

Source: Journal of Viral Hepatitis. Apr2015, Vol. 22 Issue 4, p366-375. 10p.

Recording of transmission phase gratings in glass by ion implantation.

Authors: Bányász, I. Fried, M. Dücső, Cs

Source: Applied Physics Letters; December 3 2001, Vol. 79 Issue 23, p3755-3757, 3p