Search Results - "Guillou CL"

STEM-EELS study of beam damage in polymers and extra-terrestrial organic matter using direct electron detectors.

Authors: Laforet S Guillou CL Teurtrie A et al.

Source: Ultramicroscopy [Ultramicroscopy] 2026 Apr; Vol. 282, pp. 114309. Date of Electronic Publication: 2026 Jan 03.

Publication Type: Journal Article

Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE; PubMed not MEDLINE