Search Results - "McIntyre PC"

In Situ Visualization via X-Ray Diffraction of Phase Transformations During Flash Lamp Annealing.

Authors: Ruano Arens CE Saini B Thampy V et al.

Source: Small methods [Small Methods] 2026 Jun 15, pp. e70768. Date of Electronic Publication: 2026 Jun 15.

Publication Type: Journal Article

Journal Info: Publisher: WILEY-VCH Verlag GmbH & Co. KGaA Country of Publication: Germany NLM ID: 101724536 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2366-9608 (Electronic) Linking ISSN: 23669608 NLM ISO Abbreviation: Small Methods Subsets: MEDLINE

Scaling nanoribbon transistors with monolayer transition metal dichalcogenides.

Authors: Peña T Persson AEO Krayev A et al.

Source: Nature nanotechnology [Nat Nanotechnol] 2026 Jun; Vol. 21 (6), pp. 803-809. Date of Electronic Publication: 2026 Jun 02.

Publication Type: Journal Article

Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101283273 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1748-3395 (Electronic) Linking ISSN: 17483387 NLM ISO Abbreviation: Nat Nanotechnol Subsets: MEDLINE; PubMed not MEDLINE

Gate-Dielectric Engineering with an Ultrathin Silicon Oxide Interfacial Dipole Layer for Low-Leakage Oxide-Semiconductor Memories.

Authors: Athena FF Hartanto J Passlack M et al.

Source: Nano letters [Nano Lett] 2026 Mar 18; Vol. 26 (10), pp. 3338-3346. Date of Electronic Publication: 2026 Feb 23.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101088070 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1530-6992 (Electronic) Linking ISSN: 15306984 NLM ISO Abbreviation: Nano Lett Subsets: MEDLINE; PubMed not MEDLINE

Dimensional Scaling of Ferroelectric Properties of Hafnia-Zirconia Thin Films: Electrode Interface Effects.

Authors: Huang F Saini B Wan L et al.

Source: ACS nano [ACS Nano] 2024 Jul 09; Vol. 18 (27), pp. 17600-17610. Date of Electronic Publication: 2024 Jun 25.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101313589 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1936-086X (Electronic) Linking ISSN: 19360851 NLM ISO Abbreviation: ACS Nano Subsets: MEDLINE; PubMed not MEDLINE

Atomic Layer Deposition of WO3-Doped In2O3 for Reliable and Scalable BEOL-Compatible Transistors.

Authors: Yoo C Hartanto J Saini B et al.

Source: Nano letters [Nano Lett] 2024 May 15; Vol. 24 (19), pp. 5737-5745. Date of Electronic Publication: 2024 Apr 30.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101088070 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1530-6992 (Electronic) Linking ISSN: 15306984 NLM ISO Abbreviation: Nano Lett Subsets: MEDLINE; PubMed not MEDLINE

Enhanced Switching Reliability of Hf0.5Zr0.5O2 Ferroelectric Films Induced by Interface Engineering.

Authors: Huang F Saini B Yu Z et al.

Source: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2023 Nov 01; Vol. 15 (43), pp. 50246-50253. Date of Electronic Publication: 2023 Oct 19.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: MEDLINE; PubMed not MEDLINE

Nanocrystallite Seeding of Metastable Ferroelectric Phase Formation in Atomic Layer-Deposited Hafnia-Zirconia Alloys.

Authors: Yu Z Saini B Liu Y et al.

Source: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2022 Nov 30; Vol. 14 (47), pp. 53057-53064. Date of Electronic Publication: 2022 Nov 17.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: MEDLINE; PubMed not MEDLINE

Bending and precipitate formation mechanisms in epitaxial Ge-core/GeSn-shell nanowires.

Authors: Meng AC Wang Y Braun MR et al.

Source: Nanoscale [Nanoscale] 2021 Oct 28; Vol. 13 (41), pp. 17547-17555. Date of Electronic Publication: 2021 Oct 28.

Publication Type: Journal Article

Journal Info: Publisher: RSC Pub Country of Publication: England NLM ID: 101525249 Publication Model: Electronic Cited Medium: Internet ISSN: 2040-3372 (Electronic) Linking ISSN: 20403364 NLM ISO Abbreviation: Nanoscale Subsets: MEDLINE; PubMed not MEDLINE

Link between Gas Phase Reaction Chemistry and the Electronic Conductivity of Atomic Layer Deposited Titanium Oxide Thin Films.

Authors: Babadi AS Tang-Kong R McIntyre PC

Source: The journal of physical chemistry letters [J Phys Chem Lett] 2021 Apr 15; Vol. 12 (14), pp. 3625-3632. Date of Electronic Publication: 2021 Apr 07.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101526034 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1948-7185 (Electronic) Linking ISSN: 19487185 NLM ISO Abbreviation: J Phys Chem Lett Subsets: MEDLINE; PubMed not MEDLINE

In-situ reflectometry to monitor locally-catalyzed initiation and growth of nanowire assemblies.

Authors: Braun MR Güniat L Fontcuberta I Morral A et al.

Source: Nanotechnology [Nanotechnology] 2020 Aug 14; Vol. 31 (33), pp. 335703. Date of Electronic Publication: 2020 Apr 28.

Publication Type: Journal Article

Journal Info: Publisher: IOP Pub Country of Publication: England NLM ID: 101241272 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1361-6528 (Electronic) Linking ISSN: 09574484 NLM ISO Abbreviation: Nanotechnology Subsets: MEDLINE; PubMed not MEDLINE

Atomic layer-deposited tunnel oxide stabilizes silicon photoanodes for water oxidation.

Authors: Chen YW Prange JD Dühnen S et al.

Source: Nature materials [Nat Mater] 2011 Jun 19; Vol. 10 (7), pp. 539-44. Date of Electronic Publication: 2011 Jun 19.

Publication Type: Journal Article

Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101155473 Publication Model: Electronic Cited Medium: Internet ISSN: 1476-4660 (Electronic) Linking ISSN: 14761122 NLM ISO Abbreviation: Nat Mater Subsets: PubMed not MEDLINE

Understanding the Mechanism of Electronic Defect Suppression Enabled by Nonidealities in Atomic Layer Deposition.

Authors: Kavrik MS Bostwick A Rotenberg E et al.

Source: Journal of the American Chemical Society [J Am Chem Soc] 2020 Jan 08; Vol. 142 (1), pp. 134-145. Date of Electronic Publication: 2019 Dec 26.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 7503056 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1520-5126 (Electronic) Linking ISSN: 00027863 NLM ISO Abbreviation: J Am Chem Soc Subsets: MEDLINE; PubMed not MEDLINE

Phase-field investigation of the stages in radial growth of core-shell Ge/Ge1-xSnx nanowires.

Authors: Wang Y Meng AC McIntyre PC et al.

Source: Nanoscale [Nanoscale] 2019 Nov 21; Vol. 11 (45), pp. 21974-21980.

Publication Type: Journal Article

Journal Info: Publisher: RSC Pub Country of Publication: England NLM ID: 101525249 Publication Model: Print Cited Medium: Internet ISSN: 2040-3372 (Electronic) Linking ISSN: 20403364 NLM ISO Abbreviation: Nanoscale Subsets: MEDLINE; PubMed not MEDLINE

Single-crystal germanium layers grown on silicon by nanowire seeding.

Authors: Hu S Leu PW Marshall AF et al.

Source: Nature nanotechnology [Nat Nanotechnol] 2009 Oct; Vol. 4 (10), pp. 649-53. Date of Electronic Publication: 2009 Aug 23.

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101283273 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1748-3395 (Electronic) Linking ISSN: 17483387 NLM ISO Abbreviation: Nat Nanotechnol Subsets: PubMed not MEDLINE

Nanowires for Energy Applications: Fundamental Growth Studies.

Authors: Marshall, AF Goldthorpe, IA Koto, M et al.

Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Jul2009 Supplement 2; Vol. 15 (S2).

Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276

Engineering High- k/SiGe Interface with ALD Oxide for Selective GeO x Reduction.

Authors: Kavrik MS Ercius P Cheung J et al.

Source: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2019 Apr 24; Vol. 11 (16), pp. 15111-15121. Date of Electronic Publication: 2019 Apr 15.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: PubMed not MEDLINE

Dynamic thermal emission control with InAs-based plasmonic metasurfaces.

Authors: Park J Kang JH Liu X et al.

Source: Science advances [Sci Adv] 2018 Dec 07; Vol. 4 (12), pp. eaat3163. Date of Electronic Publication: 2018 Dec 07 (Print Publication: 2018).

Publication Type: Journal Article

Journal Info: Publisher: American Association for the Advancement of Science Country of Publication: United States NLM ID: 101653440 Publication Model: eCollection Cited Medium: Internet ISSN: 2375-2548 (Electronic) Linking ISSN: 23752548 NLM ISO Abbreviation: Sci Adv Subsets: PubMed not MEDLINE

The Role of Catalyst Adhesion in ALD-TiO2 Protection of Water Splitting Silicon Anodes.

Authors: Tang-Kong R Winter R Brock R et al.

Source: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2018 Oct 31; Vol. 10 (43), pp. 37103-37109. Date of Electronic Publication: 2018 Oct 22.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: PubMed not MEDLINE

Ultralow Defect Density at Sub-0.5 nm HfO2/SiGe Interfaces via Selective Oxygen Scavenging.

Authors: Kavrik MS Thomson E Chagarov E et al.

Source: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2018 Sep 12; Vol. 10 (36), pp. 30794-30802. Date of Electronic Publication: 2018 Aug 27.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: PubMed not MEDLINE

Thermal Stability of Mixed Cation Metal Halide Perovskites in Air.

Authors: Tan W Bowring AR Meng AC et al.

Source: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2018 Feb 14; Vol. 10 (6), pp. 5485-5491. Date of Electronic Publication: 2018 Jan 30.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: PubMed not MEDLINE