Search Results - "Microprocessor testing"

Probabilistic Bug-Masking Analysis for Post-Silicon Tests in Microprocessor Verification.

Authors: Doowon Lee Kolan, Tom Morgenshtein, Arkadiy et al.

Source: DAC: Annual ACM/IEEE Design Automation Conference; Jun2016, p138-143, 6p

AMD busts Ryzen performance myths, clearing Windows 10 from blame.

Authors: UNG, GORDON MAH

Source: PCWorld; Apr2017, Vol. 35 Issue 4, p9-13, 5p, 1 Color Photograph, 3 Graphs

Stability of nano-fluids and their use for thermal management of a microprocessor: an experimental and numerical study.

Authors: Shoukat, Ahmad Adnan Shaban, Muhammad Israr, Asif et al.

Source: Heat & Mass Transfer. Sep2018, Vol. 54 Issue 9, p2771-2782. 12p.

Subjects: Microprocessor testing, Thermal management (Electronic packaging), Heat transfer, Aluminum oxide, Deionization of water, Reynolds number

Microprocessor-based digitizers combined with preamplifiers and detectors as a solution for EMI suppression.

Authors: Dreval, M.B. Ozherelyev, F.I.

Source: Fusion Engineering & Design. Apr2018, Vol. 129, p345-349. 5p.

Subjects: Microprocessor testing, Preamplifiers, Detectors, Fusion reactors, Stellarators

Microprocessor Testing: Functional Meets Structural Test.

Authors: Touati, A. Bosio, A. Girard, P. et al.

Source: Journal of Circuits, Systems & Computers. Aug2017, Vol. 26 Issue 8, p-1. 18p.

Subjects: Microprocessor testing, Computer software testing, Fault tolerance (Engineering), Algorithms, Integrated circuits

A Flexible Framework for the Automatic Generation of SBST Programs.

Authors: Riefert, Andreas Cantoro, Riccardo Sauer, Matthias et al.

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. Oct2016, Vol. 24 Issue 10, p3055-3066. 12p.

Subjects: Microprocessor testing, Built-in self tests (Engineering), Manufacturing defects, Computers testing, Automatic test equipment, Prevention

A Comparison Study of Friction Measurements for Chip Seal.

Authors: Lee, Jusang Lee, Jaejun Kim, Y. Richard et al.

Source: Journal of Testing & Evaluation. Jul2012, Vol. 40 Issue 4, p603-611. 9p.

Subjects: Microprocessor testing, Pendulums, Pavements, Material fatigue

Geographic Terms: North America

Optimal sample length for efficient cache simulation

Authors: Eeckhout, Lieven Niar, Smaïl De Bosschere, Koen

Source: Journal of Systems Architecture. Sep2005, Vol. 51 Issue 9, p513-525. 13p.

Subjects: Microprocessors, Microprocessor testing, Education, Algorithms

Extensible environment for test program generation for microprocessors.

Authors: Kamkin, A. Sergeeva, T. Smolov, S. et al.

Source: Programming & Computer Software. Jan2014, Vol. 40 Issue 1, p1-9. 9p.

Subjects: Microprocessor programming, Microprocessor testing, Computers testing, Test generators, Automotive electronics, Compilers (Computer programs), Computer software

Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces.

Authors: Gleichner, Christian Vierhaus, Heinrich T.

Source: Journal of Circuits, Systems & Computers; Aug2017, Vol. 26 Issue 8, p-1, 17p

Selective Replication: A Lightweight Technique for Soft Errors.

Authors: Vera, Xavier Abella, Jaume Carretero, Javier

Source: ACM Transactions on Computer Systems; December 2009, Vol. 27 Issue 4, p8:1-8:30, 30p

Bottom-up approach in automated embedded memory model generation for high-performance microprocessors.

Authors: Bhadra, J. Abadir, M. S. Burgess, D.

Source: IEE Proceedings -- Computers & Digital Techniques; September 2006, Vol. 153 Issue 5, p302-312, 11p

Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores.

Authors: Han, Taewoo Choi, Inhyuk Kang, Sungho

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Aug2015, Vol. 23 Issue 8, p1439-1447, 9p

Thermal Protection of Vector-Controlled IM Drive Based on DC Current Injection.

Authors: Matic, Petar R. Gecic, Marko A. Lekic, Djordje M. et al.

Source: IEEE Transactions on Industrial Electronics; Apr2015, Vol. 62 Issue 4, p2082-2089, 8p

A Functional Approach for Testing the Reorder Buffer Memory.

Authors: Di Carlo, S. Gaudesi, M. Sanchez, E. et al.

Source: Journal of Electronic Testing. Aug2014, Vol. 30 Issue 4, p469-481. 13p.

Software-Based Testing for System Peripherals.

Authors: Grosso, M. Perez Holguin, W. Sanchez, E. et al.

Source: Journal of Electronic Testing. Apr2012, Vol. 28 Issue 2, p189-200. 12p.

An introduction to boundary scan testing.

Authors: Connell, J. Daniel

Source: Electronics Now; Jun97, Vol. 68, p49-55, 7p

Detecting SEEs in Microprocessors Through a Non-Intrusive Hybrid Technique.

Authors: Azambuja, José Rodrigo Lapolli, Ângelo Rosa, Lucas

Source: IEEE Transactions on Nuclear Science; Jun2011 Part 2, Vol. 58 Issue 3, p993-1000, 8p

Predictive Temperature-Aware DVFS.

Authors: Lee, Jong Sung Skadron, Kevin Chung, Sung Woo

Source: IEEE Transactions on Computers; January 2010, Vol. 59 Issue 1, p127-133, 7p

Clock and Reset Transients in a 90 nm RHBD Single-Core Tilera Processor.

Authors: Cabanas-Holmen, Manuel Cannon, Ethan H. Kleinosowski, A. J.

Source: IEEE Transactions on Nuclear Science; Dec2009 Part 1 of 2, Vol. 56 Issue 6, p3505-3510, 6p