Search Results - "Mihailovic M"

This result is not displayed to guests.
Login for full access.

Thermally detected optical absorption and photoluminescence studies of InGaAsN/GaAs quantum wells.

Authors: Bouragba, T. Mihailovic, M. Carrère, H.

Source: IEE Proceedings -- Optoelectronics; Oct2004, Vol. 151 Issue 5, p309-312, 4p

Reference Shelf for Russian Teachers.

Authors: Iowa Univ., Iowa City. Mihailovic, M.

Source: Iowa Foreign Language Bulletin. Apr 1966 9(3):6-10.

Peer Reviewed: N

Page Count: 6

Descriptors: Bibliographies, Dictionaries, Encyclopedias, Foreign Language Books, Foreign Language Periodicals, Grammar, History Textbooks, Instructional Materials, Language Learning Levels, Literature, Reference Materials, Russian, Second Language Learning, Study Guides, Textbooks

Journal Code: RIESEP1969

Determination of the refractive indices of AlN, GaN, and AlxGa1-xN grown on (111)Si substrates.

Authors: Antoine-Vincent, N. Natali, F. Mihailovic, M.

Source: Journal of Applied Physics; May 1 2003, Vol. 93 Issue 9, p5222-5226, 5p

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

This result is not displayed to guests.
Login for full access.

High reflectance dielectric distributed Bragg reflectors for near ultra-violet planar microcavities: SiO2/HfO2 versus SiO2/SiNx.

Authors: Réveret, F. Bignet, L. Zhigang, W. et al.

Source: Journal of Applied Physics; 9/7/2016, Vol. 120 Issue 9, p1-10, 10p, 3 Charts, 10 Graphs

Optical and excitonic properties of ZnO films

Authors: Mihailovic, M. Henneghien, A.-L. Faure, S. et al.

Source: Optical Materials. Jan2009, Vol. 31 Issue 3, p532-536. 5p.

Subjects: Optical properties, Thin films, Electric properties of thin films, Zinc oxide thin films, Gallium nitride, Ellipsometry, Molecular beam epitaxy, Substrates (Materials science), Dielectrics