Search Results - "MuDer Jeng"

Management and control of information flow in CIM systems using UML and Petri nets.

Authors: Chang-Pin Lin Li-Der Jeng Yi-Ping Lin et al.

Source: International Journal of Computer Integrated Manufacturing; Mar-May2005, Vol. 18 Issue 2/3, p107-121, 15p

Separation model design of manufacturing systems using the distributed agent-oriented Petri net.

Authors: Chung-Hsien Kuo Han-Pang Huang Muder Jeng et al.

Source: International Journal of Computer Integrated Manufacturing; Mar-May2005, Vol. 18 Issue 2/3, p146-157, 12p

An Expanded SEMATECH CIM Framework for Heterogeneous Applications Integration.

Authors: Chang-Pin Lin MuDer Jeng

Source: IEEE Transactions on Systems, Man & Cybernetics: Part A. Jan2006, Vol. 36 Issue 1, p76-90. 15p.

Subjects: Computer integrated manufacturing systems, Manufacturing processes, System analysis, Production planning, Industrial design, Engineering

ERCN* Merged Nets for Modeling Degraded Behavior and Parallel Processes in Semiconductor Manufacturing Systems.

Authors: MuDer Jeng Xiaolan Xie Sheng-Luen Chung, Laura

Source: IEEE Transactions on Systems, Man & Cybernetics: Part A. Jan2004, Vol. 34 Issue 1, p102-112. 11p.

Subjects: Petri nets, Graph theory, Qualitative research, Semiconductors, Plant engineering, Operations research

Guest Editorial.

Authors: MengChu Zhou Muder Jeng Maria Pia Fanti

Source: IEEE Transactions on Systems, Man & Cybernetics: Part A. Jan2004, Vol. 34 Issue 1, p1-4. 4p.

Subjects: Computer operating systems, Computer system failures, Computer software, Computer networks, Database management, Production control

Scenario Normalization Techniques.

Authors: Sheng-Luen Chung Muder Jeng

Source: IEEE Robotics & Automation Magazine. Sep2004, Vol. 11 Issue 3, p14-21. 8p. 1 Black and White Photograph, 9 Diagrams.

Subjects: Servomechanisms, Manufacturing cells, Photolithography, Manufacturing processes

Markovian Timed Petri Nets for Performance Analysis of Semiconductor Manufacturing Systems.

Authors: MuDer Jeng Xiaolan Xie

Source: IEEE Transactions on Systems, Man & Cybernetics: Part B. Oct2000, Vol. 30 Issue 5, p757. 15p. 1 Black and White Photograph, 13 Diagrams, 1 Chart, 17 Graphs.

Subjects: Petri nets, Flexible manufacturing systems, Semiconductor industry

Analysis of modularly composed nets by siphons.

Authors: MuDer Jeng Xiaolan Xie

Source: IEEE Transactions on Systems, Man & Cybernetics: Part A. Jul99, Vol. 29 Issue 4, p399. 8p. 11 Diagrams, 1 Chart.

Subjects: Nets (Mathematics), Modular construction, Manufacturing processes, Mathematical models

A Maximally Permissive Deadlock Prevention Policy for FMS Based on Petri Net Siphon Control and the Theory of Regions.

Authors: Zhiwu Li MengChu Zhou MuDer Jeng

Source: IEEE Transactions on Automation Science & Engineering; Jan2008, Vol. 5 Issue 1, p182-188, 7p

Process Nets With Resources for Manufacturing Modeling and Their Analysis.

Authors: MuDer Jeng Xiaolan Xie MaoYu Peng

Source: IEEE Transactions on Robotics & Automation. Dec2002, Vol. 18 Issue 6, p875. 15p. 2 Black and White Photographs, 24 Diagrams, 1 Chart.

Modeling and Analysis of Semiconductor Manufacturing Systems With Degraded Behavior Using Petri....

Authors: Muder Jeng Xiaolan Xie

Source: IEEE Transactions on Robotics & Automation. Oct2001, Vol. 17 Issue 5, p576. 13p. 2 Black and White Photographs, 19 Diagrams.

ERCN-merged nets and their analysis using siphons.

Authors: Xiaolan Xie MuDer Jeng

Source: IEEE Transactions on Robotics & Automation; 1999, Vol. 15 Issue 4, p692-703, 12p

Guest Editorial.

Authors: Muder Jeng Xiaolan Xie

Source: IEEE Transactions on Robotics & Automation. Oct2001, Vol. 17 Issue 5, p545. 3p. 2 Black and White Photographs.

Recent Advances in Semiconductor Factory Automation, Part 2: Equipment-Level Automation.

Authors: Muder Jeng Mengchu Zhou Wen-Yao, Thomas

Source: IEEE Robotics & Automation Magazine. Sep2004, Vol. 11 Issue 3, p4-4. 1p.

Subjects: Automation, Semiconductor industry, Factories, Stepping motors, Materials handling, Hoisting machinery

Computationally Improved Optimal Control Methodology for Linear Programming Problems of Flexible Manufacturing Systems.

Authors: Yen-Liang Pan Yi-Sheng Huang Yi-Shun Weng et al.

Source: Journal of Applied Mathematics. 2013, p1-11. 11p.

Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection.

Authors: Chuan-Yu Chang Chun-Hsi Li Si-Yan Lin et al.

Source: IEEE Transactions on Systems, Man & Cybernetics: Part C - Applications & Reviews. May2009, Vol. 39 Issue 3, p352-365. 14p. 1 Diagram, 4 Charts.