Search Results - "Musch, Thomas"
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Source: IEEE Journal of Solid-State Circuits; October 2009, Vol. 44 Issue 10, p2655-2662, 8p
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Source: IEEE Transactions on Microwave Theory & Techniques; June 2006 pt2, Vol. 54 Issue 6, p2768-2773, 6p
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Source: IEEE Transactions on Instrumentation & Measurement; April 2005, Vol. 54 Issue 2, p709-712, 4p
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Authors: Musch, Thomas
Source: IEEE Transactions on Instrumentation & Measurement; April 2003, Vol. 52 Issue 2, p324-327, 4p
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Source: IEEE Transactions on Instrumentation & Measurement; April 2001, Vol. 50 Issue 2, p373-376, 4p
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Source: IEEE Transactions on Instrumentation & Measurement; April 2001, Vol. 50 Issue 2, p389-392, 4p
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Source: IEEE Transactions on Plasma Science; Nov2021, Vol. 49 Issue 11, Part 1, p3293-3298, 6p
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Source: IEEE Transactions on Microwave Theory & Techniques; Nov2021, Vol. 69 Issue 11, Part 2, p5033-5044, 12p
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Source: IEEE Transactions on Instrumentation & Measurement; Oct2020, Vol. 69 Issue 10, p7825-7836, 12p
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Source: Sensors (14248220). May2024, Vol. 24 Issue 9, p2673. 23p.
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Source: Scientific Reports. 2/19/2024, Vol. 14 Issue 1, p1-12. 12p.
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Source: IEEE Transactions on Microwave Theory & Techniques; Oct2019, Vol. 67 Issue 7, p3973-3982, 10p
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Source: IEEE Transactions on Microwave Theory & Techniques; Sep2018, Vol. 66 Issue 9, p3937-3946, 10p
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Source: IEEE Transactions on Instrumentation & Measurement. Sep2015, Vol. 64 Issue 9, p2574-2582. 9p.
Subjects: Phase noise, Frequency synthesizers, Time-domain reflectometry, Electromagnetic measurements, Ground penetrating radar
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A Novel Localization System in SAR-Demining Applications Using Invariant Radar Channel Fingerprints.
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Source: Sensors (14248220). Nov2022, Vol. 22 Issue 22, p8688. 21p.
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Source: Frequenz; Mar2017, Vol. 31 Issue 3/4, p195-205, 11p
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Source: IEEE Transactions on Instrumentation & Measurement. Apr99, Vol. 48 Issue 2, p634. 4p. 3 Black and White Photographs, 3 Diagrams, 6 Graphs.
Subjects: Electronic modulation, Waveguides
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Source: IEEE Transactions on Microwave Theory & Techniques; Mar2016, Vol. 64 Issue 3, p847-858, 12p
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Source: IEEE Transactions on Instrumentation & Measurement; May2015, Vol. 64 Issue 5, p1188-1195, 8p