Search Results - "Partridge, Jim G."

All‐Optical Electric Field Sensing with Nanodiamond‐Doped Polymer Thin Films.

Authors: Styles, Roy Han, Mengke Goris, Toon et al.

Source: Advanced Functional Materials; 12/23/2025, Vol. 35 Issue 52, p1-9, 9p

Effects of film thickness and electrode spacing on the performance of Ga2O3 MSM UV-C photodetectors for optical communication.

Authors: Tran, Hiep N. Nagib, Hilal Ho, Anh et al.

Source: Materials Science in Semiconductor Processing; Aug2026, Vol. 211, pN.PAG-N.PAG, 1p

Temperature-Dependent Electrical Characteristics and Extraction of Richardson Constant from Graphitic-C/n-Type 6H-SiC Schottky Diodes.

Authors: Pham, Hung Tran, Hiep N. Holland, Anthony S. et al.

Source: Journal of Electronic Materials; Apr2019, Vol. 48 Issue 4, p2061-2066, 6p, 5 Graphs

Room-Temperature Negative Differential Resistance in Amorphous Carbon: The Role of Electron Trapping Defects at Device Interfaces.

Authors: Le, Phuong Y. Gazzana, Amanda Murdoch, Billy J. et al.

Source: IEEE Transactions on Electron Devices; Feb2021, Vol. 68 Issue 2, p720-725, 6p

Electroformed, Self‐Connected Tin Oxide Nanoparticle Networks for Electronic Reservoir Computing.

Authors: Le, Phuong Y. Murdoch, Billy J. Barlow, Anders J. et al.

Source: Advanced Electronic Materials; Jul2020, Vol. 6 Issue 7, p1-7, 7p

Neuromorphic sensing of TDP-43 antigen–antibody binding using an ionic liquid channel field effect transistor.

Authors: Sylvander, Luke A. Guo, Enyi Losurdo, Linda et al.

Source: APL Electronic Devices. Mar2026, Vol. 2 Issue 1, p1-8. 8p.

Electrically conducting Bi cluster-assembled wires formed using SiN nanostencils

Authors: Partridge, Jim G. Mackenzie, David M.A. Reichel, René et al.

Source: Microelectronic Engineering. Apr-Sep2006, Vol. 83 Issue 4-9, p1460-1463. 4p.

Subjects: Electric conductivity, Cluster analysis (Statistics), Breakdown voltage, Semiconductors

RF sputtered Ga2O3 thin-films for solar-blind UV-C detection: Investigating effects of crystallinity, stoichiometry, and ambient.

Authors: Sharma, Sidhant Le, Phuong Y. Allen, Martin W. et al.

Source: APL Electronic Devices. Sep2025, Vol. 1 Issue 3, p1-10. 10p.

Influence of point defects on the near edge structure of hexagonal boron nitride.

Authors: McDougall, Nicholas L. Partridge, Jim G. Nicholls, Rebecca J. et al.

Source: Physical Review B. 10/8/2017, Vol. 96 Issue 14, p1-1. 1p.

Device quality ZnO grown using a Filtered Cathodic Vacuum Arc

Authors: Elzwawi, Salim Kim, Hyung Suk Heinhold, Robert et al.

Source: Physica B. Aug2012, Vol. 407 Issue 15, p2903-2906. 4p.

Neuromorphic sensing of biomolecules covalently immobilised on polydimethyl glutarimide.

Authors: Sylvander, Luke A. Le, Phuong Y. Tran, Hiep N. et al.

Source: Analytica Chimica Acta. Oct2023, Vol. 1279, pN.PAG-N.PAG. 1p.

Combined role of H2O and O2 adsorbates on the persistent UV photoconductivity of perfectly square SnO2 nanotubes.

Authors: Adams RL Le Ster M Tran HN et al.

Source: Nanoscale [Nanoscale] 2025 Oct 16; Vol. 17 (40), pp. 23492-23502. Date of Electronic Publication: 2025 Oct 16.

Publication Type: Journal Article

Journal Info: Publisher: RSC Pub Country of Publication: England NLM ID: 101525249 Publication Model: Electronic Cited Medium: Internet ISSN: 2040-3372 (Electronic) Linking ISSN: 20403364 NLM ISO Abbreviation: Nanoscale Subsets: MEDLINE; PubMed not MEDLINE

The near edge structure of hexagonal boron nitride.

Authors: McDougall NL Nicholls RJ Partridge JG et al.

Source: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2014 Aug; Vol. 20 (4), pp. 1053-9. Date of Electronic Publication: 2014 Apr 23.

Publication Type: Journal Article

Journal Info: Publisher: Oxford University Press Country of Publication: England NLM ID: 9712707 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1435-8115 (Electronic) Linking ISSN: 14319276 NLM ISO Abbreviation: Microsc Microanal Subsets: PubMed not MEDLINE

Tin oxide artificial synapses for low power temporal information processing.

Authors: Le PY Tran HN Zhao ZC et al.

Source: Nanotechnology [Nanotechnology] 2019 Aug 09; Vol. 30 (32), pp. 325201. Date of Electronic Publication: 2019 Apr 16.

Publication Type: Journal Article

Journal Info: Publisher: IOP Pub Country of Publication: England NLM ID: 101241272 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1361-6528 (Electronic) Linking ISSN: 09574484 NLM ISO Abbreviation: Nanotechnology Subsets: PubMed not MEDLINE

Trends in Nanotechnology 2008.

Authors: Partridge JG; Applied Physics, RMIT University Melbourne, 3001, Australia. jim.partridge@rmit.edu.au

Source: Small (Weinheim an der Bergstrasse, Germany) [Small] 2009 Jan; Vol. 5 (1), pp. 20-1.

Publication Type: Conference Proceedings

Journal Info: Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 101235338 Publication Model: Print Cited Medium: Internet ISSN: 1613-6829 (Electronic) Linking ISSN: 16136810 NLM ISO Abbreviation: Small Subsets: MEDLINE