Search Results - "Salazar Bloise, Félix"

Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films.

Authors: Lozano, Yaiza Levy, David Salazar-Bloise, Félix

Source: Sensors (14248220). Mar2026, Vol. 26 Issue 5, p1431. 20p.

Analysis of Corrosion by Speckle Polarimetry.

Authors: Gascón, Francisco Rodríguez, Jorge Bayón, Ana et al.

Source: Sensors (14248220). Aug2025, Vol. 25 Issue 16, p4941. 16p.

Low-pass filtering compensation in common-path digital holographic microscopy.

Authors: Dong, Jie Yetisen, Ali K. Dong, Xingchen et al.

Source: Applied Physics Letters; 9/21/2020, Vol. 117 Issue 12, p1-5, 5p

Rauheitsauswertung mit hoher lateraler Auflösung mittels räumlicher Lichtmodulatoren / Roughness evaluation with high lateral resolution by spatial light modulators.

Authors: Pöller, Franziska Bilgeri, Laura Maria Jakobi, Martin et al.

Source: Technisches Messen; 2019 Supplement1, Vol. 86, p22-26, 5p

Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain.

Authors: Pöller, Franziska Salazar Bloise, Félix Jakobi, Martin et al.

Source: Sensors (14248220). Aug2021, Vol. 21 Issue 16, p5572-5572. 1p.

Non-Contact Roughness Measurement in Sub-Micron Range by Considering Depolarization Effects.

Authors: Pöller, Franziska Salazar Bloise, Félix Jakobi, Martin et al.

Source: Sensors (14248220). May2019, Vol. 19 Issue 10, p2215. 1p.