Search Results - "Salazar-Bloise, Félix"

Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films.

Authors: Lozano, Yaiza Levy, David Salazar-Bloise, Félix

Source: Sensors (14248220). Mar2026, Vol. 26 Issue 5, p1431. 20p.

Low-pass filtering compensation in common-path digital holographic microscopy.

Authors: Dong, Jie Yetisen, Ali K. Dong, Xingchen et al.

Source: Applied Physics Letters; 9/21/2020, Vol. 117 Issue 12, p1-5, 5p

Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain.

Authors: Pöller, Franziska Salazar Bloise, Félix Jakobi, Martin et al.

Source: Sensors (14248220). Aug2021, Vol. 21 Issue 16, p5572-5572. 1p.

Rauheitsauswertung mit hoher lateraler Auflösung mittels räumlicher Lichtmodulatoren / Roughness evaluation with high lateral resolution by spatial light modulators.

Authors: Pöller, Franziska Bilgeri, Laura Maria Jakobi, Martin et al.

Source: Technisches Messen; 2019 Supplement1, Vol. 86, p22-26, 5p

Analysis of Corrosion by Speckle Polarimetry.

Authors: Gascón, Francisco Rodríguez, Jorge Bayón, Ana et al.

Source: Sensors (14248220). Aug2025, Vol. 25 Issue 16, p4941. 16p.

Non-Contact Roughness Measurement in Sub-Micron Range by Considering Depolarization Effects.

Authors: Pöller, Franziska Salazar Bloise, Félix Jakobi, Martin et al.

Source: Sensors (14248220). May2019, Vol. 19 Issue 10, p2215. 1p.

Rauheitsmessung an pharmazeutischen Tabletten mittels Angularer Speckle-Korrelation Roughness measurement on pharmaceutical tablets using angular speckle correlation.

Authors: Salazar Bloise, Félix Aulbach, Laura Jakobi, Martin et al.

Source: Technisches Messen; Jun2014, Vol. 81 Issue 6, p289-295, 7p

Simultaneous dual-directional shearography enabled by phase manipulating Fresnel lenses.

Authors: Zhu, Zirui Chang, Qing Qi, Siyuan et al.

Source: Optics Communications. Apr2026, Vol. 603, pN.PAG-N.PAG. 1p.

Super-compact shearography based on a single diffractive optical element with 3-in-1 phase mask.

Authors: Wang S Gao S Tang H et al.

Source: Optics letters [Opt Lett] 2022 Oct 15; Vol. 47 (20), pp. 5409-5412.

Publication Type: Journal Article

Journal Info: Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 7708433 Publication Model: Print Cited Medium: Internet ISSN: 1539-4794 (Electronic) Linking ISSN: 01469592 NLM ISO Abbreviation: Opt Lett Subsets: MEDLINE; PubMed not MEDLINE

Non-Contact Surface Roughness Measurement by Implementation of a Spatial Light Modulator.

Authors: Aulbach L Salazar Bloise F Lu M et al.

Source: Sensors (Basel, Switzerland) [Sensors (Basel)] 2017 Mar 15; Vol. 17 (3). Date of Electronic Publication: 2017 Mar 15.

Publication Type: Journal Article

Journal Info: Publisher: MDPI Country of Publication: Switzerland NLM ID: 101204366 Publication Model: Electronic Cited Medium: Internet ISSN: 1424-8220 (Electronic) Linking ISSN: 14248220 NLM ISO Abbreviation: Sensors (Basel) Subsets: PubMed not MEDLINE

Shear-unlimited common-path speckle interferometer.

Authors: Dong J Wang S Yetisen AK et al.

Source: Optics letters [Opt Lett] 2020 Mar 15; Vol. 45 (6), pp. 1305-1308.

Publication Type: Journal Article

Journal Info: Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 7708433 Publication Model: Print Cited Medium: Internet ISSN: 1539-4794 (Electronic) Linking ISSN: 01469592 NLM ISO Abbreviation: Opt Lett Subsets: MEDLINE; PubMed not MEDLINE

Dual-directional shearography based on a modified common-path configuration using spatial phase shift.

Authors: Wang S Dong J Pöller F et al.

Source: Applied optics [Appl Opt] 2019 Jan 20; Vol. 58 (3), pp. 593-603.

Publication Type: Journal Article

Journal Info: Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 0247660 Publication Model: Print Cited Medium: Internet ISSN: 1539-4522 (Electronic) Linking ISSN: 1559128X NLM ISO Abbreviation: Appl Opt Subsets: PubMed not MEDLINE