Search Results - "Solbach, Axel"

Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films.

Authors: Cao, Jiang-Li Solbach, Axel Klemradt, Uwe

Source: Journal of the American Ceramic Society; April 2006, Vol. 89 Issue 4, p1321-1325, 5p

Effects of Thermal Annealing on Lead Zirconate Titanate Thin Film Capacitors with Platinum Electrodes.

Authors: Cao, Jiang-Li Solbach, Axel Fang, Yan

Source: Journal of the Electrochemical Society; Nov2007, Vol. 154 Issue 11, pG251-G254, 4p

Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films.

Authors: Jiang-Li Cao Solbach, Axel Klemradt, Uwe et al.

Source: Journal of the American Ceramic Society; Apr2006, Vol. 89 Issue 4, p1321-1325, 5p, 2 Black and White Photographs, 1 Chart, 2 Graphs

X-ray reflectivity studies of ferroelectric and dielectric multilayer structures

Authors: Cao, Jiang-Li Solbach, Axel Klemradt, Uwe

Source: Physica B. Feb2005, Vol. 357 Issue 1/2, p122-125. 4p.

Subjects: Ferroelectric crystals, Dielectric devices, Electric resistors, Random access memory

Effects of Thermal Annealing on Lead Zirconate Titanate Thin Film Capacitors with Platinum Electrodes.

Authors: Jiang-Li Cao Solbach, Axel Yan Fang et al.

Source: Journal of The Electrochemical Society. Nov2007, Vol. 154 Issue 11, pG251-G254. 4p. 2 Black and White Photographs, 1 Chart, 6 Graphs.

Subjects: Annealing of metals, Thin films, Capacitors, Ferroelectric crystals, Electrodes, Dielectrics

Probing fatigue in ferroelectric thin films with subnanometer depth resolution.

Authors: Cao, Jiang-Li Solbach, Axel Klemradt, Uwe

Source: Applied Physics Letters; August 13 2007, Vol. 91 Issue 7, p072905-072905, 1p

Density inhomogeneity in ferroelectric thin films.

Authors: Cao, Jiang-Li Solbach, Axel Klemradt, Uwe

Source: Applied Physics Letters; July 31 2006, Vol. 89 Issue 5, p052901-052901, 1p

Structural investigations of Pt/TiOx electrode stacks for ferroelectric thin film devices.

Authors: Cao, Jiang-Li Solbach, Axel Klemradt, Uwe

Source: Journal of Applied Physics; June 1 2006, Vol. 99 Issue 11, p114107-114107, 1p

Structural investigations of Pt/TiOx electrode stacks for ferroelectric thin film devices.

Authors: Jiang-Li Cao Solbach, Axel Klemradt, Uwe et al.

Source: Journal of Applied Physics. 6/1/2006, Vol. 99 Issue 11, p114107. 7p. 2 Black and White Photographs, 1 Diagram, 1 Chart, 4 Graphs.

Density inhomogeneity in ferroelectric thin films.

Authors: Jiang-Li Cao Solbach, Axel Klemradt, Uwe et al.

Source: Applied Physics Letters. 7/31/2006, Vol. 89 Issue 5, p052901. 3p. 1 Black and White Photograph, 1 Chart, 1 Graph.

CORRECTION.

Authors: Cao, Jiang-Li Solbach, Axel Klemrad, Uwe et al.

Source: Journal of the American Ceramic Society; Nov2006, Vol. 89 Issue 11, p3597-3597, 1p