Search Results - "Solbach, Axel"

Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films.

Authors: Cao, Jiang-Li Solbach, Axel Klemradt, Uwe

Source: Journal of the American Ceramic Society; April 2006, Vol. 89 Issue 4, p1321-1325, 5p

Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films.

Authors: Jiang-Li Cao Solbach, Axel Klemradt, Uwe et al.

Source: Journal of the American Ceramic Society; Apr2006, Vol. 89 Issue 4, p1321-1325, 5p, 2 Black and White Photographs, 1 Chart, 2 Graphs

Probing fatigue in ferroelectric thin films with subnanometer depth resolution.

Authors: Cao, Jiang-Li Solbach, Axel Klemradt, Uwe et al.

Source: Applied Physics Letters. 8/13/2007, Vol. 91 Issue 7, p072905. 3p. 1 Chart, 3 Graphs.

Structural investigations of Pt/TiOx electrode stacks for ferroelectric thin film devices.

Authors: Cao, Jiang-Li Solbach, Axel Klemradt, Uwe

Source: Journal of Applied Physics; June 1 2006, Vol. 99 Issue 11, p114107-114107, 1p