Search Results - "Song, Myeongho"

P‐29: Noise reduction and defect detection algorithm in white‐light scanning interferometry for display panel inspection.

Authors: Cho, Sanghoon Jung, Seungyeop Song, Myeongho

Source: SID Symposium Digest of Technical Papers; Jun2023, Vol. 54 Issue 1, p1421-1424, 4p

P‐236: Late‐News Poster: Hard defect detection and classification for display panel products.

Authors: Cho, Sanghoon Kim, Sangsoo Song, Myeongho et al.

Source: SID Symposium Digest of Technical Papers; Jun2024, Vol. 55 Issue 1, p1617-1618, 2p

Automated Visual Inspection of Defects in Transparent Display Layers Using Light-Field 3-D Imaging.

Authors: Jang, Hyeonjoong Cho, Sanghoon Jeon, Daniel S. et al.

Source: IEEE Transactions on Semiconductor Manufacturing; Aug2023, Vol. 36 Issue 3, p486-493, 8p

Issue Information.

Source: SID Symposium Digest of Technical Papers; Jun2024, Vol. 55 Issue 1, pi-lxiii, 1p

Determining the influence of ship hull deformations caused by draught change on shaft alignment application using FE analysis.

Authors: Seo, Chul-Oh Jeong, Byongug Kim, Jung-Ryul et al.

Source: Ocean Engineering; Aug2020, Vol. 210, pN.PAG-N.PAG, 1p

Issue Information.

Source: SID Symposium Digest of Technical Papers; Jun2023, Vol. 54 Issue 1, pi-lii, 1p