Search Results - "Tohei, T."
-
1
Authors: et al.
Source: Scientific reports [Sci Rep] 2019 Oct 17; Vol. 9 (1), pp. 15166. Date of Electronic Publication: 2019 Oct 17.
Publication Type: Published Erratum
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE
HTML Full Text PDF Full Text -
2
Authors: et al.
Source: Applied Sciences (2076-3417); Jan2026, Vol. 16 Issue 1, p193, 12p
HTML Full Text PDF Full Text -
3
Authors: et al.
Source: Crystals (2073-4352); Apr2026, Vol. 16 Issue 4, p265, 33p
HTML Full Text PDF Full Text -
4
Authors: et al.
Source: Journal of Materials Science: Materials in Electronics; Jan2025, Vol. 36 Issue 2, p1-10, 10p
HTML Full Text PDF Full Text -
5
Authors: et al.
Source: Journal of Materials Science: Materials in Electronics; Apr2025, Vol. 36 Issue 10, p1-13, 13p
HTML Full Text PDF Full Text -
6
Authors: et al.
Source: Materials (1996-1944). Feb2026, Vol. 19 Issue 4, p711. 12p.
HTML Full Text PDF Full Text -
7
Authors: et al.
Source: Journal of Electronic Materials; Mar2025, Vol. 54 Issue 3, p1937-1948, 12p
HTML Full Text PDF Full Text -
8
Authors:
Source: Journal of the American Ceramic Society; Jun2025, Vol. 108 Issue 6, p1-16, 16p
HTML Full Text PDF Full Text -
9
Authors: et al.
Source: Journal of the American Ceramic Society; Jun2025, Vol. 108 Issue 6, p1-12, 12p
HTML Full Text PDF Full Text -
10
Authors: et al.
Source: Metallurgical & Materials Transactions. Part A; Apr2025, Vol. 56 Issue 4, p1477-1491, 15p
HTML Full Text PDF Full Text -
11
Authors: et al.
Source: Journal of Materials Science: Materials in Electronics; Nov2024, Vol. 35 Issue 31, p1-16, 16p
HTML Full Text PDF Full Text -
12
Authors: et al.
Source: Nanomaterials (2079-4991). Feb2026, Vol. 16 Issue 3, p158. 13p.
Subjects: Dislocations in crystals, Gallium nitride films, Substrates (Materials science), Surface morphology, Cathodoluminescence, Atomic force microscopy, Modulation-doped field-effect transistors
HTML Full Text PDF Full Text -
13
Authors: et al.
Source: Scientific reports [Sci Rep] 2025 Apr 18; Vol. 15 (1), pp. 13486. Date of Electronic Publication: 2025 Apr 18.
Publication Type: Journal Article
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE
HTML Full Text PDF Full Text -
14
Authors: et al.
Source: Journal of Applied Physics; 6/14/2024, Vol. 135 Issue 22, p1-10, 10p
-
15
Authors: et al.
Source: Journal of Communications Technology & Electronics; Apr2023, Vol. 68 Issue 4, p413-419, 7p
HTML Full Text PDF Full Text -
16
Authors:
Source: Coatings (2079-6412); Jul2024, Vol. 14 Issue 7, p880, 21p
HTML Full Text PDF Full Text -
17
Authors: et al.
Source: Crystals (2073-4352); Feb2023, Vol. 13 Issue 2, p287, 10p
HTML Full Text PDF Full Text -
18
Authors: et al.
Source: Journal of the American Ceramic Society; May2024, Vol. 107 Issue 5, p2973-2985, 13p
HTML Full Text PDF Full Text -
19
Authors: et al.
Source: Crystals (2073-4352); Apr2024, Vol. 14 Issue 4, p299, 19p
HTML Full Text PDF Full Text -
20
Authors: et al.
Source: Journal of Materials Science: Materials in Electronics; Dec2021, Vol. 32 Issue 24, p28144-28151, 8p
HTML Full Text PDF Full Text