Search Results - "Toth R"
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Source: Review of Scientific Instruments; December 2003, Vol. 74 Issue 12, p5035-5038, 4p
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Source: Applied Optics; June 1 1996, Vol. 35, p2828-2848, 21p
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Source: Applied Optics; March 15 1983, Vol. 22, p908-926, 19p
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Source: Journal of Applied Physics; August 1966, Vol. 37, p3367-3370, 4p
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Source: Journal of Applied Physics; March 1964, Vol. 35, p698-703, 6p
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Source: Journal of Applied Physics; November 1962, Vol. 33, p3250-3256, 7p
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Authors: et al.
Source: Computer Graphics Forum; May2014, Vol. 33 Issue 2, p341-350, 10p, 11 Color Photographs, 1 Chart
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Use of simulation in the NDE qualification process in France: application to the EPR RPV inspection.
Authors: et al.
Source: Insight: Non-Destructive Testing & Condition Monitoring. Dec2010, Vol. 52 Issue 12, p652-656. 5p. 4 Color Photographs, 5 Diagrams, 2 Graphs.
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Source: Review of Scientific Instruments; August 2005, Vol. 76 Issue 8, p083701-083701, 1p
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