Search Results - "Twitchett-Harrison AC"

Glass Transition, Liquid Dynamics, and Thermal Degradation in 2D Hybrid Halide Perovskites.

Authors: Houghton OS Ye C Twitchett-Harrison AC et al.

Source: Small (Weinheim an der Bergstrasse, Germany) [Small] 2025 May; Vol. 21 (19), pp. e2500311. Date of Electronic Publication: 2025 Apr 02.

Publication Type: Journal Article

Journal Info: Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 101235338 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1613-6829 (Electronic) Linking ISSN: 16136810 NLM ISO Abbreviation: Small Subsets: MEDLINE; PubMed not MEDLINE

Reinterpretation of Report of Tetrataenite in Bulk Alloy Castings.

Authors: Houghton OS Loudon JC Twitchett-Harrison AC et al.

Source: Advanced science (Weinheim, Baden-Wurttemberg, Germany) [Adv Sci (Weinh)] 2025 Jan; Vol. 12 (4), pp. e2408796. Date of Electronic Publication: 2024 Dec 16.

Publication Type: Journal Article

Journal Info: Publisher: WILEY-VCH Country of Publication: Germany NLM ID: 101664569 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2198-3844 (Electronic) Linking ISSN: 21983844 NLM ISO Abbreviation: Adv Sci (Weinh) Subsets: MEDLINE; PubMed not MEDLINE

Real-space imaging of confined magnetic skyrmion tubes.

Authors: Birch MT Cortés-Ortuño D Turnbull LA et al.

Source: Nature communications [Nat Commun] 2020 Apr 07; Vol. 11 (1), pp. 1726. Date of Electronic Publication: 2020 Apr 07.

Publication Type: Journal Article

Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE

Confinement of Skyrmions in Nanoscale FeGe Device-like Structures.

Authors: Twitchett-Harrison AC Loudon JC Pepper RA et al.

Source: ACS applied electronic materials [ACS Appl Electron Mater] 2022 Sep 27; Vol. 4 (9), pp. 4427-4437. Date of Electronic Publication: 2022 Sep 07.

Publication Type: Journal Article

Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101734996 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2637-6113 (Electronic) Linking ISSN: 26376113 NLM ISO Abbreviation: ACS Appl Electron Mater Subsets: PubMed not MEDLINE

Quantitative off-axis electron holography of GaAs p-n junctions prepared by focused ion beam milling.

Authors: Cooper D Truche R Twitchett-Harrison AC et al.

Source: Journal of microscopy [J Microsc] 2009 Jan; Vol. 233 (1), pp. 102-13.

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

Journal Info: Publisher: Published for the Royal Microscopical Society by Blackwell Scientific Publications Country of Publication: England NLM ID: 0204522 Publication Model: Print Cited Medium: Internet ISSN: 1365-2818 (Electronic) Linking ISSN: 00222720 NLM ISO Abbreviation: J Microsc Subsets: PubMed not MEDLINE

Do Images of Biskyrmions Show Type-II Bubbles?

Authors: Loudon JC Twitchett-Harrison AC Cortés-Ortuño D et al.

Source: Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2019 Apr; Vol. 31 (16), pp. e1806598. Date of Electronic Publication: 2019 Mar 07.

Publication Type: Journal Article

Journal Info: Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 9885358 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1521-4095 (Electronic) Linking ISSN: 09359648 NLM ISO Abbreviation: Adv Mater Subsets: PubMed not MEDLINE

Towards quantitative electrostatic potential mapping of working semiconductor devices using off-axis electron holography.

Authors: Yazdi S Kasama T Beleggia M et al.

Source: Ultramicroscopy [Ultramicroscopy] 2015 May; Vol. 152, pp. 10-20. Date of Electronic Publication: 2014 Dec 31.

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: PubMed not MEDLINE

Finite element simulations of electrostatic dopant potentials in thin semiconductor specimens for electron holography.

Authors: Somodi PK Twitchett-Harrison AC Midgley PA et al.

Source: Ultramicroscopy [Ultramicroscopy] 2013 Nov; Vol. 134, pp. 160-6. Date of Electronic Publication: 2013 Jul 16.

Publication Type: Journal Article; Research Support, Non-U.S. Gov't

Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE

Quantitative electron holographic tomography for the 3D characterisation of semiconductor device structures.

Authors: Twitchett-Harrison AC Yates TJ Dunin-Borkowski RE et al.

Source: Ultramicroscopy [Ultramicroscopy] 2008 Oct; Vol. 108 (11), pp. 1401-7. Date of Electronic Publication: 2008 Jun 25.

Publication Type: Journal Article

Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0304-3991 (Print) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: PubMed not MEDLINE

Mapping the electrical properties of semiconductor junctions--the electron holographic approach.

Authors: Twitchett-Harrison AC Dunin-Borkowski RE Midgley PA

Source: Scanning [Scanning] 2008 Jul-Aug; Vol. 30 (4), pp. 299-309.

Publication Type: Journal Article

Journal Info: Publisher: Hindawi in collaboration with John Wiley & Sons, Inc Country of Publication: England NLM ID: 7903371 Publication Model: Print Cited Medium: Print ISSN: 0161-0457 (Print) Linking ISSN: 01610457 NLM ISO Abbreviation: Scanning Subsets: PubMed not MEDLINE