Search Results - "Wada T"

Zr-based bulk metallic glass clamp cell for high-pressure inelastic neutron scattering.

Authors: Hayashida, S. Wada, T. Ishikado, M. et al.

Source: High Pressure Research. Apr2026, p1-13. 13p. 8 Illustrations.

Fabrication of Porous Iron with Directional Pores through Thermal Decomposition of Chromium Nitride.

Authors: Wada, T. Ide, T. Nakajima, H.

Source: Metallurgical & Materials Transactions. Part A; Dec2009, Vol. 40A Issue 13, p3204-3209, 6p

High-power AlGaN/GaN HFET with lower on-state resistance and higher switching time for an inverter circuit.

Authors: Yoshida, S. Li, J. Wada, T.

Source: IEE Proceedings -- Circuits, Devices & Systems; Jun2004, Vol. 151 Issue 3, p207-210, 4p

A mathematical modelling of Elkind recovery.

Authors: Wada, T. Manabe, Y. Kinugawa, T.

Source: Annals of the ICRP. May2026, p1.

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Relationship between environmental radiation and radioactivity and childhood thyroid cancer found in Fukushima health management survey.

Authors: Toki, H. Wada, T. Manabe, Y. et al.

Source: Scientific Reports. 3/5/2020, Vol. 10 Issue 1, p1-12. 12p.

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A Consensus Protocol over Noisy Two‐Layered Networks with Cooperative and Antagonistic Interactions.

Authors: Nguyen, L. T. H. Wada, T. Masubuchi, I. et al.

Source: Asian Journal of Control; Jan2018, Vol. 20 Issue 1, p548-557, 10p

Creep-rupture properties, resistance to temper embrittlement and to attack by hydrogen of a 1.4 percent Mn, 0.25 percent Mo, 0.03 percent Cb steel.

Authors: Wada, T. Sponseller, D. L.

Source: Journal of Engineering Materials & Technology; July 1975, Vol. 97, p234-244, 11p

The influence of passivation layer on aluminum corrosion on simulated microelectronics circuit pattern.

Authors: Wada, T. Sugimoto, M. Ajiki, T.

Source: Journal of the Electrochemical Society; March 1989, Vol. 136, p732-735, 4p

Relationship between width and spacing of aluminum electrodes and aluminum corrosion on simulated microelectronic circuit patterns.

Authors: Wada, T. Sugimoto, M. Ajiki, T.

Source: Journal of the Electrochemical Society; March 1987, Vol. 134, p649-653, 5p

Analysis of corrosion on aluminum double-layer metallization.

Authors: Wada, T. Higuchi, H. Ajiki, T.

Source: Journal of the Electrochemical Society; February 1986, Vol. 133, p362-366, 5p

Progress of road-automobile communication system.

Authors: Takada, K. Wada, T.

Source: Journal of Transportation Engineering; July/August 1990, Vol. 116, p436-441, 6p

Spectral change of femtosecond pulses due to induced amplitude and phase modulations.

Authors: Tokunaga, E. Terasaki, A. Wada, T.

Source: Journal of the Optical Society of America. B, Optical Physics; December 1993, Vol. 10, p2364-2370, 7p

Complex defects introduced into Si by high-energy electron irradiation.

Authors: Wada, T.

Source: Journal of Applied Physics; June 1977, Vol. 48, p2145-2152, 8p

Electrically reprogrammable ROM using N-channel memory transistors with floating gate.

Authors: Wada, T.

Source: Solid-State Electronics; July 1977, Vol. 20, p623-627, 5p