Search Results - "X-ray reflection"

NOVEL SOLUTION TO IMPROVE THE MOSS BAG TECHNIQUE IN ENVIRONMENTAL BIOLOGICAL MONITORING.

Authors: Nguyen Thi Minh Sang Nguyen An Son Le Hong Khiem et al.

Source: Environmental Engineering & Management Journal (EEMJ). Jun2025, Vol. 24 Issue 6, p1273-1281. 9p.

Probing burst–disc interaction and disc reflection in SAX J1808.4−3658 with NICER, XMM–Newton , and NuSTAR.

Authors: Mandal, Manoj Naik, Sachindra Chhotaray, Birendra

Source: Monthly Notices of the Royal Astronomical Society; 5/10/2026, Vol. 548 Issue 2, p1-13, 13p

Determination of Arsenic in Water by Total Reflection X-Ray Fluorescence Spectrometry (TXRF) by Capture on a Copper Film.

Authors: Bennun, Leonardo Marcó Parra, Lué Merú Greaves, Eduardo D.

Source: Analytical Letters. 2025, Vol. 58 Issue 4, p680-687. 8p.

Comparison of Selected Crystal Structures of Rod-like Molecules with Acid and Ester Terminal Groups.

Authors: Zugenmaier, Peter¹, zugenmaier@pc.tu-clausthal.de

Source: Crystals (2073-4352); Feb2025, Vol. 15 Issue 2, p102, 17p

The Influence of Temperature and Stoichiometry on the Optical Properties of CdSe Nanoplatelets.

Authors: Koshkinbayev, Yerkebulan Ospanova, Aigerim Akhmetova, Aizhan et al.

Source: Nanomaterials (2079-4991). Nov2024, Vol. 14 Issue 22, p1794. 10p.

Subjects: X-ray reflection, Semiconductor synthesis, Optical properties, Transmission electron microscopy, Ultraviolet-visible spectroscopy

Broad iron line as a relativistic reflection from warm corona in AGNs.

Authors: Biswas, P. P. Różańska, A. Vincent, F. H. et al.

Source: Astronomy & Astrophysics / Astronomie et Astrophysique. 2026, Vol. 707, p1-18. 18p.

Polarization of reflected X-ray emission from the Sgr A molecular complex: Multiple flares, multiple sources?

Authors: Khabibullin, Ildar Churazov, Eugene Ferrazzoli, Riccardo et al.

Source: Astronomy & Astrophysics / Astronomie et Astrophysique. 2026, Vol. 707, p1-17. 17p.

X-ray reverberation black hole mass and distance estimates of Cygnus X-1.

Authors: O'Neill, Patrick Ingram, Adam Nathan, Edward et al.

Source: Monthly Notices of the Royal Astronomical Society; Feb2026, Vol. 545 Issue 4, p1-18, 18p

A novel approach to simultaneously determine elements in seawater using total reflection X-ray fluorescence spectroscopy.

Authors: Kozhevnikov, Aleksandr Lakhmanov, Dmitry Pobliahin, Emil et al.

Source: Analytical Methods in Environmental Chemistry Journal. 2024, Vol. 7 Issue 3, p83-98. 16p.

Universal simulation of absorption effects for X‐ray diffraction in reflection geometry.

Authors: Dallmann, Johannes Graetz, Jonas Hock, Rainer

Source: Acta Crystallographica. Section A, Foundations & Advances. Jul2024, Vol. 80 Issue 4, p315-328. 14p.

Quantification of Calcium, Phosphorus, and Cerium in Novel Biocompatible Materials by Total Reflection X-Ray Fluorescence Spectroscopy.

Authors: Samoilova, A. A. Petrakova, N. V. Andreeva, N. A. et al.

Source: Inorganic Materials. Jan2024, Vol. 60 Issue 1, p33-37. 5p.

Subjects: Mass attenuation coefficients, X-ray reflection, Compton scattering, Biomedical materials, Fluorescence spectroscopy

Development of a cascade impactor optimized for size-fractionated analysis of aerosol metal content by total reflection X-ray fluorescence spectroscopy (TXRF).

Authors: Crazzolara, Claudio Held, Andreas

Source: Atmospheric Measurement Techniques. 2024, Vol. 17 Issue 7, p2183-2194. 12p.

XRISMニュース (6) : X-ray Mirror Assembly (XMA) の開発. (Japanese)

Authors: 林 多佳由¹, thayashi@umbc.edu

Source: Astronomical Herald; Dec2025, Vol. 118 Issue 12, p731-735, 5p

The analysis of the soft X-ray excess in the narrow-line Seyfert 1 galaxy Mrk 382.

Authors: Xu, Xinpeng Ding, Nan Gu, Qiusheng

Source: Monthly Notices of the Royal Astronomical Society; Nov2025, Vol. 543 Issue 4, p3981-3992, 12p

Stitching Interferometry for X-Ray Mirror Metrology at the Hefei Advanced Light Facility (HALF).

Authors: Wang, Yanghui Zhao, Yifan Wang, Huiyun et al.

Source: Photonics; Nov2025, Vol. 12 Issue 11, p1106, 17p

The shape and ionization of equatorial matter near compact objects from X-ray polarization reflection signatures.

Authors: Podgorný, J.¹ (AUTHOR) jakub.podgorny@asu.cas.cz

Source: Astronomy & Astrophysics / Astronomie et Astrophysique. 2025, Vol. 702, p1-19. 19p.

2D‐RIXS: resonant inelastic X‐ray scattering microscopy with high energy and spatial resolutions.

Authors: Yamamoto, Kohei Suzuki, Hakuto Miyawaki, Jun

Source: Journal of Synchrotron Radiation. May2026, Vol. 33 Issue 3, p739-745. 7p.

Chemical Analysis of CsPbBr2X (X = Cl, I) Nanocomposites by Total Reflection X-Ray Fluorescence Spectroscopy (TXRF).

Authors: Filatova, D. G. Chizhov, A. S. Rumyantseva, M. N.

Source: Inorganic Materials. Dec2023, Vol. 59 Issue 14, p1414-1417. 4p.

Subjects: X-ray reflection, Analytical chemistry, Fluorescence spectroscopy, X-ray spectroscopy, Nanocomposite materials, X-ray fluorescence

Quantification of Si Dopant in β-Ga2O3-Based Semiconductor Gas Sensors by Total Reflection X-Ray Fluorescence Spectroscopy (TXRF).

Authors: Filatova, D. G. Bogdanova, A. P. Krivetskiy, V. V. et al.

Source: Inorganic Materials. Dec2023, Vol. 59 Issue 14, p1433-1436. 4p.

Subjects: Gas detectors, X-ray reflection, Fluorescence spectroscopy, X-ray spectroscopy, Doping agents (Chemistry), X-ray fluorescence, Sapphires

Geographic Terms: Germany

Effect of sample carriers on analytical parameters in total reflection X-ray fluorescence - a tool for multi-trace elemental analysis.

Authors: Manjunatha Bennal, A. S. Badiger, N. M. et al.

Source: Spectroscopy Letters. 2024, Vol. 57 Issue 1, p45-58. 14p.