Special issue for the ICST 2013 conference.

Saved in:
Bibliographic Details
Title: Special issue for the ICST 2013 conference.
Authors: Baudry, Benoit1, Benoit.Baudry@inria.fr, Orso, Alessandro2, orso@cc.gatech.edu
Source: Software Testing: Verification & Reliability; Jun2015, Vol. 25 Issue 4, p333-333, 1p
Database: Applied Science & Technology Source
Full text is not displayed to guests.
Description
ISSN:09600833
DOI:10.1002/stvr.1578