APA (7th ed.) Citation

Han, T., Choi, I., & Kang, S. (2015). Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 23(8), 1439. https://doi.org/10.1109/TVLSI.2014.2341674

Chicago Style (17th ed.) Citation

Han, Taewoo, Inhyuk Choi, and Sungho Kang. "Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23, no. 8 (2015): 1439. https://doi.org/10.1109/TVLSI.2014.2341674.

MLA (9th ed.) Citation

Han, Taewoo, et al. "Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 23, no. 8, 2015, p. 1439, https://doi.org/10.1109/TVLSI.2014.2341674.