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Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores.

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Bibliographic Details
Title: Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores.
Authors: Han, Taewoo1, Choi, Inhyuk1, Kang, Sungho1
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Aug2015, Vol. 23 Issue 8, p1439-1447, 9p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 108535736
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/TVLSI.2014.2341674
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      – Code: eng
        Text: English
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        PageCount: 9
        StartPage: 1439
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      – TitleFull: Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores.
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            NameFull: Han, Taewoo
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            NameFull: Choi, Inhyuk
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            NameFull: Kang, Sungho
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              M: 08
              Text: Aug2015
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              Y: 2015
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