View in EDS

Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores.

Saved in:
Bibliographic Details
Title: Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores.
Authors: Han, Taewoo1, Choi, Inhyuk1, Kang, Sungho1
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Aug2015, Vol. 23 Issue 8, p1439-1447, 9p
Database: Applied Science & Technology Source
Be the first to leave a comment!
You must be logged in first