INVITED - A Box of Dots: Using Scan-Based Path Delay Test for Timing Verification.
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| Title: | INVITED - A Box of Dots: Using Scan-Based Path Delay Test for Timing Verification. |
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| Authors: | Crouch, Alfred L.1, al.crouch@siliconaid.com, Potter, John C.2, jpotter@asset-intertech.com |
| Source: | DAC: Annual ACM/IEEE Design Automation Conference; Jun2016, p1030-1035, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 0738100X |
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| DOI: | 10.1145/2897937.2905001 |
