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INVITED - A Box of Dots: Using Scan-Based Path Delay Test for Timing Verification.

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Bibliographic Details
Title: INVITED - A Box of Dots: Using Scan-Based Path Delay Test for Timing Verification.
Authors: Crouch, Alfred L.1, al.crouch@siliconaid.com, Potter, John C.2, jpotter@asset-intertech.com
Source: DAC: Annual ACM/IEEE Design Automation Conference; Jun2016, p1030-1035, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
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PubType: Conference
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  Data: INVITED - A Box of Dots: Using Scan-Based Path Delay Test for Timing Verification.
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  Data: <searchLink fieldCode="AU" term="%22Crouch%2C+Alfred+L%2E%22">Crouch, Alfred L.</searchLink><relatesTo>1</relatesTo>, <i>al.crouch@siliconaid.com</i><br /><searchLink fieldCode="AU" term="%22Potter%2C+John+C%2E%22">Potter, John C.</searchLink><relatesTo>2</relatesTo>, <i>jpotter@asset-intertech.com</i>
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      – Type: doi
        Value: 10.1145/2897937.2905001
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 6
        StartPage: 1030
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      – TitleFull: INVITED - A Box of Dots: Using Scan-Based Path Delay Test for Timing Verification.
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            – D: 01
              M: 06
              Text: Jun2016
              Type: published
              Y: 2016
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