APA (7th ed.) Citation

YOO, B., LEE, S., & WON, Y. (2018). Analyzing the Storage Defects From the Perspective of Synthetic Fault Injection. Journal of Information Science & Engineering, 34(1), 1. https://doi.org/10.6688/JISE.2018.34.1.1

Chicago Style (17th ed.) Citation

YOO, BALGEUN, SEONGJIN LEE, and YOUJIP WON. "Analyzing the Storage Defects From the Perspective of Synthetic Fault Injection." Journal of Information Science & Engineering 34, no. 1 (2018): 1. https://doi.org/10.6688/JISE.2018.34.1.1.

MLA (9th ed.) Citation

YOO, BALGEUN, et al. "Analyzing the Storage Defects From the Perspective of Synthetic Fault Injection." Journal of Information Science & Engineering, vol. 34, no. 1, 2018, p. 1, https://doi.org/10.6688/JISE.2018.34.1.1.