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Analyzing the Storage Defects From the Perspective of Synthetic Fault Injection.

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Title: Analyzing the Storage Defects From the Perspective of Synthetic Fault Injection.
Authors: BALGEUN YOO1, starhunter@hanyang.ac.kr, SEONGJIN LEE2, yjwon@hanyang.ac.kr, YOUJIP WON1, 2insight@gnu.ac.kr
Source: Journal of Information Science & Engineering; Jan2018, Vol. 34 Issue 1, p1-20, 20p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 127352712
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Analyzing the Storage Defects From the Perspective of Synthetic Fault Injection.
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=127352712
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.6688/JISE.2018.34.1.1
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      – Code: eng
        Text: English
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        PageCount: 20
        StartPage: 1
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      – TitleFull: Analyzing the Storage Defects From the Perspective of Synthetic Fault Injection.
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            NameFull: BALGEUN YOO
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            NameFull: SEONGJIN LEE
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              Text: Jan2018
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              Y: 2018
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