APA (7th ed.) Citation

Luo, Q., He, Y., & Sun, Y. (2018). Time-efficient fault detection and diagnosis system for analog circuits. Automatika: Journal for Control, Measurement, Electronics, Computing & Communications, 59(3/4), 302. https://doi.org/10.1080/00051144.2018.1541644

Chicago Style (17th ed.) Citation

Luo, Qiwu, Yigang He, and Yichuang Sun. "Time-efficient Fault Detection and Diagnosis System for Analog Circuits." Automatika: Journal for Control, Measurement, Electronics, Computing & Communications 59, no. 3/4 (2018): 302. https://doi.org/10.1080/00051144.2018.1541644.

MLA (9th ed.) Citation

Luo, Qiwu, et al. "Time-efficient Fault Detection and Diagnosis System for Analog Circuits." Automatika: Journal for Control, Measurement, Electronics, Computing & Communications, vol. 59, no. 3/4, 2018, p. 302, https://doi.org/10.1080/00051144.2018.1541644.