APA (7th ed.) Citation

Myeong, I., Son, D., Kim, H., Kang, M., Jeon, J., & Shin, H. (2019). Thermal-Aware Shallow Trench Isolation Design Optimization for Minimizing ${I}_{OFF}$ in Various Sub-10-nm 3-D Transistors. IEEE Transactions on Electron Devices, 66(1), 647. https://doi.org/10.1109/TED.2018.2882577

Chicago Style (17th ed.) Citation

Myeong, Ilho, Dokyun Son, Hyunsuk Kim, Myounggon Kang, Jongwook Jeon, and Hyungcheol Shin. "Thermal-Aware Shallow Trench Isolation Design Optimization for Minimizing ${I}_{OFF}$ in Various Sub-10-nm 3-D Transistors." IEEE Transactions on Electron Devices 66, no. 1 (2019): 647. https://doi.org/10.1109/TED.2018.2882577.

MLA (9th ed.) Citation

Myeong, Ilho, et al. "Thermal-Aware Shallow Trench Isolation Design Optimization for Minimizing ${I}_{OFF}$ in Various Sub-10-nm 3-D Transistors." IEEE Transactions on Electron Devices, vol. 66, no. 1, 2019, p. 647, https://doi.org/10.1109/TED.2018.2882577.