Zheng, J., Okamura, H., & Dohi, T. (2020). A transient interval reliability analysis for software rejuvenation models with phase expansion. Software Quality Journal, 28(1), 173. https://doi.org/10.1007/s11219-019-09458-1
Chicago Style (17th ed.) CitationZheng, Junjun, Hiroyuki Okamura, and Tadashi Dohi. "A Transient Interval Reliability Analysis for Software Rejuvenation Models with Phase Expansion." Software Quality Journal 28, no. 1 (2020): 173. https://doi.org/10.1007/s11219-019-09458-1.
MLA (9th ed.) CitationZheng, Junjun, et al. "A Transient Interval Reliability Analysis for Software Rejuvenation Models with Phase Expansion." Software Quality Journal, vol. 28, no. 1, 2020, p. 173, https://doi.org/10.1007/s11219-019-09458-1.
Warning: These citations may not always be 100% accurate.