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A transient interval reliability analysis for software rejuvenation models with phase expansion.

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Title: A transient interval reliability analysis for software rejuvenation models with phase expansion.
Authors: Zheng, Junjun1, jzheng@asl.cs.ritsumei.ac.jp, Okamura, Hiroyuki2, Dohi, Tadashi2
Source: Software Quality Journal; Mar2020, Vol. 28 Issue 1, p173-194, 22p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 143095772
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  Data: A transient interval reliability analysis for software rejuvenation models with phase expansion.
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  Data: <searchLink fieldCode="AU" term="%22Zheng%2C+Junjun%22">Zheng, Junjun</searchLink><relatesTo>1</relatesTo>, <i>jzheng@asl.cs.ritsumei.ac.jp</i><br /><searchLink fieldCode="AU" term="%22Okamura%2C+Hiroyuki%22">Okamura, Hiroyuki</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Dohi%2C+Tadashi%22">Dohi, Tadashi</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Software+Quality+Journal%22">Software Quality Journal</searchLink>; Mar2020, Vol. 28 Issue 1, p173-194, 22p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=143095772
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        Value: 10.1007/s11219-019-09458-1
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      – Code: eng
        Text: English
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        PageCount: 22
        StartPage: 173
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      – TitleFull: A transient interval reliability analysis for software rejuvenation models with phase expansion.
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            NameFull: Zheng, Junjun
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            NameFull: Okamura, Hiroyuki
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              Text: Mar2020
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              Y: 2020
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