Experimental Extraction of Impact of Depletion Capacitance on Low Frequency Noise in Sub-Micron nMOSFETs With Reverse Body Bias. - Tanaka, Chika; Adachi, Kanna; Nakayama, Atsushi; Iguchi, Yasuhiko; Yoshitomi, Sadayuki (IEEE Transactions on Semiconductor Manufacturing, 2020)