Xu, J., Tong, S., Cong, F., & Chen, J. (2017). Slip Hankel matrix series‐based singular value decomposition and its application for fault feature extraction. IET Science, Measurement & Technology (Wiley-Blackwell), 11(4), 464. https://doi.org/10.1049/iet-smt.2016.0176
Chicago Style (17th ed.) CitationXu, Jian, Shuiguang Tong, Feiyun Cong, and Jin Chen. "Slip Hankel Matrix Series‐based Singular Value Decomposition and Its Application for Fault Feature Extraction." IET Science, Measurement & Technology (Wiley-Blackwell) 11, no. 4 (2017): 464. https://doi.org/10.1049/iet-smt.2016.0176.
MLA (9th ed.) CitationXu, Jian, et al. "Slip Hankel Matrix Series‐based Singular Value Decomposition and Its Application for Fault Feature Extraction." IET Science, Measurement & Technology (Wiley-Blackwell), vol. 11, no. 4, 2017, p. 464, https://doi.org/10.1049/iet-smt.2016.0176.