Light reflectance and photoelectron yield spectroscopy enable acceptor level measurement in p-type Ba1−xTiO3 semiconductor. - Fujii, Saya; Kano, Jun; Oshime, Norihiro; Higuchi, Tohru; Nishina, Yuta; Fujii, Tatsuo; Ikeda, Naoshi; Ota, Hiromi (Journal of Applied Physics, 2021)