Excellent Mechanical Durability of In‐Folding Stress of Poly‐Si Thin‐Film Transistor on Plastic Substrate Compared with Out‐Folding: Generation of Gate Leakage Currents in Flexible Poly‐Si Thin‐Film Transistor by Out‐Folding and Bias‐Temperature Stress - Kim, Dongjin; Billah, Mohammad Masum; Lee, Suhui; Siddik, Abu Bakar; Cho, Young Joo; Jang, Jin; Lee, Jaeseob; Lee, Yongsu; Shin, Jiyeong (Advanced Engineering Materials, 2021)