Characterization of soybeans and calibration of their DEM input parameters.

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Title: Characterization of soybeans and calibration of their DEM input parameters.
Authors: Nguyen, Thiet Xuan1, Le, Lu Minh1, Nguyen, Thong Chung1, Nguyen, Nguyen Thi Hanh1, Le, Tien-Thinh2, Pham, Binh Thai3, Le, Vuong Minh1, Ly, Hai-Bang3
Source: Particulate Science & Technology; 2021, Vol. 39 Issue 5, p530-548, 19p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 150824779
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=150824779
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1080/02726351.2020.1775739
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 19
        StartPage: 530
    Titles:
      – TitleFull: Characterization of soybeans and calibration of their DEM input parameters.
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          Name:
            NameFull: Nguyen, Thiet Xuan
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            NameFull: Le, Lu Minh
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            NameFull: Nguyen, Thong Chung
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            NameFull: Nguyen, Nguyen Thi Hanh
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            NameFull: Le, Tien-Thinh
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            NameFull: Pham, Binh Thai
      – PersonEntity:
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            NameFull: Le, Vuong Minh
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            NameFull: Ly, Hai-Bang
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          Dates:
            – D: 01
              M: 08
              Text: 2021
              Type: published
              Y: 2021
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              Value: 02726351
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              Value: 39
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          Titles:
            – TitleFull: Particulate Science & Technology
              Type: main
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