Degradation Analysis of Thin Mg-xAg Wires Using X-ray Near-Field Holotomography. - Meyer, Sebastian; Wolf, Andreas; Sanders, Daniela; Iskhakova, Kamila; Ćwieka, Hanna; Bruns, Stefan; Flenner, Silja; Greving, Imke; Hagemann, Johannes; Willumeit-Römer, Regine; Wiese, Björn; Zeller-Plumhoff, Berit (Metals (2075-4701), 2021)