Chu, Z., Zhang, J., Kosut, O., & Sankar, L. (2021). $N-1$ Reliability Makes It Difficult for False Data Injection Attacks to Cause Physical Consequences. IEEE Transactions on Power Systems, 36(5), 3897. https://doi.org/10.1109/TPWRS.2021.3061480
Chicago Style (17th ed.) CitationChu, Zhigang, Jiazi Zhang, Oliver Kosut, and Lalitha Sankar. "$N-1$ Reliability Makes It Difficult for False Data Injection Attacks to Cause Physical Consequences." IEEE Transactions on Power Systems 36, no. 5 (2021): 3897. https://doi.org/10.1109/TPWRS.2021.3061480.
MLA (9th ed.) CitationChu, Zhigang, et al. "$N-1$ Reliability Makes It Difficult for False Data Injection Attacks to Cause Physical Consequences." IEEE Transactions on Power Systems, vol. 36, no. 5, 2021, p. 3897, https://doi.org/10.1109/TPWRS.2021.3061480.