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In Situ Coupling Applied Voltage and Synchrotron Radiation: Operando Characterization of Transistors.

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Title: In Situ Coupling Applied Voltage and Synchrotron Radiation: Operando Characterization of Transistors.
Authors: Davydok, Anton1, Luponosov, Yuriy N.2, Ponomarenko, Sergey A.2, Grigorian, Souren3,4, grigorian@physik.uni-siegen.de
Source: Nanoscale Research Letters; 2/2/2022, Vol. 17 Issue 1, p1-10, 10p
Database: Applied Science & Technology Source
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        Value: 10.1186/s11671-022-03662-y
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        Text: English
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              Text: 2/2/2022
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              Y: 2022
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