APA (7th ed.) Citation

Peña Corredor, A., Wendling, L., Preziosi, D., Schlur, L., Leuvrey, C., Thiaudière, D., . . . Lefevre, C. (2022). Oxygen crystallographic positions in thin films by non‐destructive resonant elastic X‐ray scattering. Journal of Applied Crystallography, 55(3), 526. https://doi.org/10.1107/S1600576722003673

Chicago Style (17th ed.) Citation

Peña Corredor, Antonio, et al. "Oxygen Crystallographic Positions in Thin Films by Non‐destructive Resonant Elastic X‐ray Scattering." Journal of Applied Crystallography 55, no. 3 (2022): 526. https://doi.org/10.1107/S1600576722003673.

MLA (9th ed.) Citation

Peña Corredor, Antonio, et al. "Oxygen Crystallographic Positions in Thin Films by Non‐destructive Resonant Elastic X‐ray Scattering." Journal of Applied Crystallography, vol. 55, no. 3, 2022, p. 526, https://doi.org/10.1107/S1600576722003673.