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Oxygen crystallographic positions in thin films by non‐destructive resonant elastic X‐ray scattering.

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Title: Oxygen crystallographic positions in thin films by non‐destructive resonant elastic X‐ray scattering.
Authors: Peña Corredor, Antonio1, antonio.penacorredor@ipcms.unistra.fr, Wendling, Laurianne1, Preziosi, Daniele1, Schlur, Laurent1, Leuvrey, Cédric1, Thiaudière, Dominique2, Elklaim, Erik2, Blanc, Nils3, Grenier, Stephane4, Roulland, François1, Viart, Nathalie1, Lefevre, Christophe1
Source: Journal of Applied Crystallography; Jun2022, Vol. 55 Issue 3, p526-532, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 157298929
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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        Value: 10.1107/S1600576722003673
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        Text: English
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              Text: Jun2022
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              Y: 2022
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