Song, Y., Lv, Z., Bai, J., Niu, S., Wu, Z., Qin, L., . . . Wang, L. (2022). Processes of the Reliability and Degradation Mechanism of High-Power Semiconductor Lasers. Crystals (2073-4352), 12(6), 765. https://doi.org/10.3390/cryst12060765
Chicago Style (17th ed.) CitationSong, Yue, et al. "Processes of the Reliability and Degradation Mechanism of High-Power Semiconductor Lasers." Crystals (2073-4352) 12, no. 6 (2022): 765. https://doi.org/10.3390/cryst12060765.
MLA (9th ed.) CitationSong, Yue, et al. "Processes of the Reliability and Degradation Mechanism of High-Power Semiconductor Lasers." Crystals (2073-4352), vol. 12, no. 6, 2022, p. 765, https://doi.org/10.3390/cryst12060765.
Warning: These citations may not always be 100% accurate.