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Processes of the Reliability and Degradation Mechanism of High-Power Semiconductor Lasers.

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Title: Processes of the Reliability and Degradation Mechanism of High-Power Semiconductor Lasers.
Authors: Song, Yue1,2, songyue@ciomp.ac.cn, Lv, Zhiyong3, lvzhiyong@stu.zzu.edu.cn, Bai, Jiaming4, baijm1119@mails.jlu.edu.cn, Niu, Shen1,2, 13623558919@163.com, Wu, Zibo5, wzb23923651592021@163.com, Qin, Li1,2, qinl@ciomp.ac.cn, Chen, Yongyi1,2,6, chenyy@ciomp.ac.cnliangl@ciomp.ac.cn, Liang, Lei1,2, leiyuxin@ciomp.ac.cn, Lei, Yuxin1,2, jiapeng@ciomp.ac.cn, Jia, Peng1,2, wanglj@ciomp.ac.cn, Shan, Xiaonan1,2, chenyy@ciomp.ac.cn, Wang, Lijun1,2,7,8
Source: Crystals (2073-4352); Jun2022, Vol. 12 Issue 6, p765-N.PAG, 26p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 157679993
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PubTypeId: academicJournal
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  Data: <searchLink fieldCode="JN" term="%22Crystals+%282073-4352%29%22">Crystals (2073-4352)</searchLink>; Jun2022, Vol. 12 Issue 6, p765-N.PAG, 26p
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        Value: 10.3390/cryst12060765
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              M: 06
              Text: Jun2022
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