Lee, Y., Ryu, J., Lee, T., Shim, J., Kim, C., & Lee, D. (2022). Failure Behavior Attributed to Internal Erosion Caused by Conduit Cracks in Homogeneous Embankment. Applied Sciences (2076-3417), 12(13), N.PAG. https://doi.org/10.3390/app12136305
Chicago Style (17th ed.) CitationLee, Young-Hak, Jung-Hyun Ryu, Tae-Ho Lee, Jae-Woong Shim, Cheol-Han Kim, and Dal-Won Lee. "Failure Behavior Attributed to Internal Erosion Caused by Conduit Cracks in Homogeneous Embankment." Applied Sciences (2076-3417) 12, no. 13 (2022): N.PAG. https://doi.org/10.3390/app12136305.
MLA (9th ed.) CitationLee, Young-Hak, et al. "Failure Behavior Attributed to Internal Erosion Caused by Conduit Cracks in Homogeneous Embankment." Applied Sciences (2076-3417), vol. 12, no. 13, 2022, p. N.PAG, https://doi.org/10.3390/app12136305.