Selective High-Resistance Zones Formed by Oxygen Annealing for -GaO Schottky Diode Applications.
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| Title: | Selective High-Resistance Zones Formed by Oxygen Annealing for -GaO Schottky Diode Applications. |
|---|---|
| Authors: | He, Qiming1, Zhou, Xuanze1, Li, Qiuyan1, Hao, Weibing1, Liu, Qi1, Han, Zhao1, Zhou, Kai1, Chen, Chen1, Peng, Jinlan1, Xu, Guangwei1, xugw@ustc.edu.cn, Zhao, Xiaolong1, Wu, Xiaojun2, Long, Shibing1, shibinglong@ustc.edu.cn |
| Source: | IEEE Electron Device Letters; Nov2022, Vol. 43 Issue 11, p1933-1936, 4p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 160687638 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=160687638 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/LED.2022.3205326 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 4 StartPage: 1933 Titles: – TitleFull: Selective High-Resistance Zones Formed by Oxygen Annealing for -GaO Schottky Diode Applications. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: He, Qiming – PersonEntity: Name: NameFull: Zhou, Xuanze – PersonEntity: Name: NameFull: Li, Qiuyan – PersonEntity: Name: NameFull: Hao, Weibing – PersonEntity: Name: NameFull: Liu, Qi – PersonEntity: Name: NameFull: Han, Zhao – PersonEntity: Name: NameFull: Zhou, Kai – PersonEntity: Name: NameFull: Chen, Chen – PersonEntity: Name: NameFull: Peng, Jinlan – PersonEntity: Name: NameFull: Xu, Guangwei – PersonEntity: Name: NameFull: Zhao, Xiaolong – PersonEntity: Name: NameFull: Wu, Xiaojun – PersonEntity: Name: NameFull: Long, Shibing IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 11 Text: Nov2022 Type: published Y: 2022 Identifiers: – Type: issn-print Value: 07413106 Numbering: – Type: volume Value: 43 – Type: issue Value: 11 Titles: – TitleFull: IEEE Electron Device Letters Type: main |
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