Development of fast scanning module with a novel bubble solution applied to scanning acoustic microscopy system for industrial nondestructive inspection. - Pham, Van Hiep; Vo, Tan Hung; Vu, Dinh Dat; Choi, Jaeyeop; Park, Sumin; Mondal, Sudip; Lee, Byeong-il; Oh, Junghwan (Expert Systems with Applications, 2023)